Non-monotonic behaviour in the mean transverse energy of electrons emitted from a reflection-mode p-GaAs(Cs,O) photocathode during its QE degradation through oxygen exposure

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Non-monotonic behaviour in the mean transverse energy of electrons emitted from a reflection-mode p-GaAs(Cs,O) photocathode during its QE degradation through oxygen exposure. / Jones, L. B.; Scheibler, H. E.; Kosolobov, S. N. et al.

In: Journal of Physics D: Applied Physics, Vol. 54, No. 20, 205301, 25.02.2021.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{fc6e50d9ef654e6b8c275437d66fc03a,

title = "Non-monotonic behaviour in the mean transverse energy of electrons emitted from a reflection-mode p-GaAs(Cs,O) photocathode during its QE degradation through oxygen exposure",

abstract = "We present a study on the evolution of both transverse and longitudinal energy distributions due to oxygen-induced quantum efficiency degradation in the electrons emitted from a reflection-mode p-GaAs(Cs,O)-photocathode over an effective electron affinity range of χ ∗∼ -0.1 eV to χ ∗∼ +0.3 eV under illumination wavelengths λ = 808, 635 and 532 nm. For λ = 635 and 532 nm, we found that the mean transverse energy of electrons emitted as the photocathode effective electron affinity increased has a non-monotonic character. Our proposed fitting model links the measured response to changes in the relative number of thermalised and non-thermalised electrons in the total emitted photocurrent.",

keywords = "degradation, electron source, energy spread, MLE, MTE, photocathode, QE",

author = "Jones, {L. B.} and Scheibler, {H. E.} and Kosolobov, {S. N.} and Terekhov, {A. S.} and Militsyn, {B. L.} and Noakes, {T. C.Q.}",

year = "2021",

month = feb,

day = "25",

doi = "10.1088/1361-6463/abe1e9",

language = "English",

volume = "54",

journal = "Journal Physics D: Applied Physics",

issn = "0022-3727",

publisher = "IOP Publishing Ltd.",

number = "20",

}

RIS

TY - JOUR

T1 - Non-monotonic behaviour in the mean transverse energy of electrons emitted from a reflection-mode p-GaAs(Cs,O) photocathode during its QE degradation through oxygen exposure

AU - Jones, L. B.

AU - Scheibler, H. E.

AU - Kosolobov, S. N.

AU - Terekhov, A. S.

AU - Militsyn, B. L.

AU - Noakes, T. C.Q.

PY - 2021/2/25

Y1 - 2021/2/25

N2 - We present a study on the evolution of both transverse and longitudinal energy distributions due to oxygen-induced quantum efficiency degradation in the electrons emitted from a reflection-mode p-GaAs(Cs,O)-photocathode over an effective electron affinity range of χ ∗∼ -0.1 eV to χ ∗∼ +0.3 eV under illumination wavelengths λ = 808, 635 and 532 nm. For λ = 635 and 532 nm, we found that the mean transverse energy of electrons emitted as the photocathode effective electron affinity increased has a non-monotonic character. Our proposed fitting model links the measured response to changes in the relative number of thermalised and non-thermalised electrons in the total emitted photocurrent.

AB - We present a study on the evolution of both transverse and longitudinal energy distributions due to oxygen-induced quantum efficiency degradation in the electrons emitted from a reflection-mode p-GaAs(Cs,O)-photocathode over an effective electron affinity range of χ ∗∼ -0.1 eV to χ ∗∼ +0.3 eV under illumination wavelengths λ = 808, 635 and 532 nm. For λ = 635 and 532 nm, we found that the mean transverse energy of electrons emitted as the photocathode effective electron affinity increased has a non-monotonic character. Our proposed fitting model links the measured response to changes in the relative number of thermalised and non-thermalised electrons in the total emitted photocurrent.

KW - degradation

KW - electron source

KW - energy spread

KW - MLE

KW - MTE

KW - photocathode

KW - QE

UR - http://www.scopus.com/inward/record.url?scp=85102658712&partnerID=8YFLogxK

U2 - 10.1088/1361-6463/abe1e9

DO - 10.1088/1361-6463/abe1e9

M3 - Article

AN - SCOPUS:85102658712

VL - 54

JO - Journal Physics D: Applied Physics

JF - Journal Physics D: Applied Physics

SN - 0022-3727

IS - 20

M1 - 205301

ER -

ID: 28258256