DOI

  • L. B. Jones
  • H. E. Scheibler
  • S. N. Kosolobov
  • A. S. Terekhov
  • B. L. Militsyn
  • T. C.Q. Noakes
Original languageEnglish
Article number205301
JournalJournal of Physics D: Applied Physics
Volume54
Issue number20
DOIs
Publication statusPublished - 25 Feb 2021

    OECD FOS+WOS

  • 2.05 MATERIALS ENGINEERING
  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

    Research areas

  • degradation, electron source, energy spread, MLE, MTE, photocathode, QE

ID: 28258256