DOI

  • K. V. Feklistov
  • A. G. Lemzyakov
  • I. P. Prosvirin
  • A. A. Gismatulin
  • A. A. Shklyaev
  • Y. A. Zhivodkov
  • G. Krivyakin
  • A. I. Komonov
  • A. S. Kozhukhov
  • E. V. Spesivsev
  • D. V. Gulyaev
  • D. S. Abramkin
  • A. M. Pugachev
  • D. G. Esaev
  • G. Y. Sidorov
Original languageEnglish
Article number125903
Number of pages11
JournalMaterials Research Express
Volume7
Issue number12
DOIs
Publication statusPublished - Dec 2020

    OECD FOS+WOS

    Research areas

  • Band offset, InO:Er, Nanowires, Photoluminescence, Silicon, Thermionic emission, Thin films, thermionic emission, band offset, photoluminescence, EXCITATION, PHOTOLUMINESCENCE, ER3+, In2O3, ELECTRICAL-PROPERTIES, SILICON, Er, ERBIUM, ELECTROLUMINESCENCE, thin films, nanowires, OXIDE THIN-FILMS, IN2O3, >

ID: 27373634