DOI

  • Vladimir A. Gritsenko
  • Vladimir A. Volodin
  • Timofey V. Perevalov
  • Vladimir N. Kruchinin
  • Alina K. Gerasimova
  • Vladimir Sh Aliev
  • Igor P. Prosvirin
Original languageEnglish
Article number425202
Number of pages9
JournalNanotechnology
Volume29
Issue number42
DOIs
Publication statusPublished - 15 Aug 2018

    OECD FOS+WOS

    Research areas

  • density functional theory, ellipsometry, nanoscale potential fluctuations, Raman scattering, ReRAM, tantalum oxide, x-ray photoelectron spectroscopy, HFOX, CHARGE-TRANSPORT, RAMAN-SCATTERING, TAOX, FILMS, SPECTROSCOPY, CRYSTALLINE

ID: 16319960