Nanoscale potential fluctuations in nonstoichiometrics tantalum oxide › Research Explorer

DOI

https://doi.org/10.1088/1361-6528/aad430
Final published version

Vladimir A. Gritsenko
Vladimir A. Volodin
Timofey V. Perevalov
Vladimir N. Kruchinin
Alina K. Gerasimova
Vladimir Sh Aliev
Igor P. Prosvirin

Original language	English
Article number	425202
Pages (from-to)	425202
Number of pages	9
Journal	Nanotechnology
Volume	29
Issue number	42
DOIs	https://doi.org/10.1088/1361-6528/aad430
Publication status	Published - 15 Aug 2018

OECD FOS+WOS

Research areas

density functional theory, ellipsometry, nanoscale potential fluctuations, Raman scattering, ReRAM, tantalum oxide, x-ray photoelectron spectroscopy, HFOX, CHARGE-TRANSPORT, RAMAN-SCATTERING, TAOX, FILMS, SPECTROSCOPY, CRYSTALLINE

ID: 16319960