Multi-element optical emission and mass-spectrometry analysis of high-purity cadmium with vacuum preconcentration by matrix volatilization

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Multi-element optical emission and mass-spectrometry analysis of high-purity cadmium with vacuum preconcentration by matrix volatilization. / Lundovskaya, Olga V.; Medvedev, Nickolay S.; Tsygankova, Alphiya R. et al.

In: Spectrochimica Acta - Part B Atomic Spectroscopy, Vol. 177, 106049, 03.2021.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{8c897616beee47c98395ae0805873596,

title = "Multi-element optical emission and mass-spectrometry analysis of high-purity cadmium with vacuum preconcentration by matrix volatilization",

abstract = "The paper discusses the development of optical-emission and mass-spectral with inductively coupled plasma (ICP-OES/MS) analysis procedures for determination of traces in cadmium. These procedures are based on the preliminary concentration of traces by selective volatilization of cadmium in vacuum through the film of its own oxide and the subsequent ICP-OES/MS analysis of concentrate. The relative concentration coefficient for the entire array of the experimental data is at least 150. The trace limits of detection (LODs) have been evaluated for the developed ICP-OES and ICP-MS analysis procedures. The ICP-OES method allows to determine 43 traces (Ag, Al, As, Au, B, Ba, Be, Ca, Ce, Co, Cr, Cu, Dy, Er, Fe, Ga, Gd, Hf, Ho, K, La, Li, Lu, Mg, Mn, Mo, Nb, Ni, Pb, Re, Sb, Sm, Sn, Sr, Ta, Tb, Ti, V, W, Y, Yb, Zn, Zr) at the concentration level from 0.1 to 40 ng·g−1. At the same time implementation of the ICP-MS method provides data about 41 impurities (Ag, Al, As, Au, B, Ba, Be, Bi, Ce, Co, Cr, Cu, Dy, Er, Ga, Gd, Hf, Ho, In, La, Lu, Mn, Mo, Nb, Ni, Pb, Re, Sb, Sm, Sn, Sr, Ta, Tb, Te, Ti, V, W, Y, Yb, Zn, Zr) with LODs from 0.002 to 10 ng·g−1.",

keywords = "cadmium selective volatilization in vacuum, ICP-MS, ICP-OES, Trace elements",

author = "Lundovskaya, {Olga V.} and Medvedev, {Nickolay S.} and Tsygankova, {Alphiya R.} and Volzhenin, {Artyom V.} and Saprykin, {Anatoly I.}",

year = "2021",

month = mar,

doi = "10.1016/j.sab.2020.106049",

language = "English",

volume = "177",

journal = "Spectrochimica Acta, Part B: Atomic Spectroscopy",

issn = "0584-8547",

publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Multi-element optical emission and mass-spectrometry analysis of high-purity cadmium with vacuum preconcentration by matrix volatilization

AU - Lundovskaya, Olga V.

AU - Medvedev, Nickolay S.

AU - Tsygankova, Alphiya R.

AU - Volzhenin, Artyom V.

AU - Saprykin, Anatoly I.

PY - 2021/3

Y1 - 2021/3

N2 - The paper discusses the development of optical-emission and mass-spectral with inductively coupled plasma (ICP-OES/MS) analysis procedures for determination of traces in cadmium. These procedures are based on the preliminary concentration of traces by selective volatilization of cadmium in vacuum through the film of its own oxide and the subsequent ICP-OES/MS analysis of concentrate. The relative concentration coefficient for the entire array of the experimental data is at least 150. The trace limits of detection (LODs) have been evaluated for the developed ICP-OES and ICP-MS analysis procedures. The ICP-OES method allows to determine 43 traces (Ag, Al, As, Au, B, Ba, Be, Ca, Ce, Co, Cr, Cu, Dy, Er, Fe, Ga, Gd, Hf, Ho, K, La, Li, Lu, Mg, Mn, Mo, Nb, Ni, Pb, Re, Sb, Sm, Sn, Sr, Ta, Tb, Ti, V, W, Y, Yb, Zn, Zr) at the concentration level from 0.1 to 40 ng·g−1. At the same time implementation of the ICP-MS method provides data about 41 impurities (Ag, Al, As, Au, B, Ba, Be, Bi, Ce, Co, Cr, Cu, Dy, Er, Ga, Gd, Hf, Ho, In, La, Lu, Mn, Mo, Nb, Ni, Pb, Re, Sb, Sm, Sn, Sr, Ta, Tb, Te, Ti, V, W, Y, Yb, Zn, Zr) with LODs from 0.002 to 10 ng·g−1.

AB - The paper discusses the development of optical-emission and mass-spectral with inductively coupled plasma (ICP-OES/MS) analysis procedures for determination of traces in cadmium. These procedures are based on the preliminary concentration of traces by selective volatilization of cadmium in vacuum through the film of its own oxide and the subsequent ICP-OES/MS analysis of concentrate. The relative concentration coefficient for the entire array of the experimental data is at least 150. The trace limits of detection (LODs) have been evaluated for the developed ICP-OES and ICP-MS analysis procedures. The ICP-OES method allows to determine 43 traces (Ag, Al, As, Au, B, Ba, Be, Ca, Ce, Co, Cr, Cu, Dy, Er, Fe, Ga, Gd, Hf, Ho, K, La, Li, Lu, Mg, Mn, Mo, Nb, Ni, Pb, Re, Sb, Sm, Sn, Sr, Ta, Tb, Ti, V, W, Y, Yb, Zn, Zr) at the concentration level from 0.1 to 40 ng·g−1. At the same time implementation of the ICP-MS method provides data about 41 impurities (Ag, Al, As, Au, B, Ba, Be, Bi, Ce, Co, Cr, Cu, Dy, Er, Ga, Gd, Hf, Ho, In, La, Lu, Mn, Mo, Nb, Ni, Pb, Re, Sb, Sm, Sn, Sr, Ta, Tb, Te, Ti, V, W, Y, Yb, Zn, Zr) with LODs from 0.002 to 10 ng·g−1.

KW - cadmium selective volatilization in vacuum

KW - ICP-MS

KW - ICP-OES

KW - Trace elements

UR - http://www.scopus.com/inward/record.url?scp=85098153976&partnerID=8YFLogxK

U2 - 10.1016/j.sab.2020.106049

DO - 10.1016/j.sab.2020.106049

M3 - Article

AN - SCOPUS:85098153976

VL - 177

JO - Spectrochimica Acta, Part B: Atomic Spectroscopy

JF - Spectrochimica Acta, Part B: Atomic Spectroscopy

SN - 0584-8547

M1 - 106049

ER -

ID: 27342095