Research output: Contribution to journal › Article › peer-review
MOCVD growth of Pt films using a novel Pt(IV) compound as a precursor. / Dorovskikh, Svetlana I.; Zharkova, Galina I.; Zelenina, Ludmila N. et al.
In: Physica Status Solidi (C) Current Topics in Solid State Physics, Vol. 12, No. 7, 01.07.2015, p. 1053-1059.Research output: Contribution to journal › Article › peer-review
}
TY - JOUR
T1 - MOCVD growth of Pt films using a novel Pt(IV) compound as a precursor
AU - Dorovskikh, Svetlana I.
AU - Zharkova, Galina I.
AU - Zelenina, Ludmila N.
AU - Asanov, Igor P.
AU - Kal'nii, Danila B.
AU - Kokovkin, Vasily V.
AU - Shubin, Yuri V.
AU - Basova, Tamara V.
AU - Morozova, Natalia B.
PY - 2015/7/1
Y1 - 2015/7/1
N2 - The Me3Pt(acac)Py compound, trimethyl(pentane-2,4-dionato)platinum(IV)pyridine, is synthesized and, for the first time, characterized by physico-chemical methods to determine its chemical composition (elemental analysis, IR-spectroscopy) and thermal behavior (thermogravimetric (TG), differential thermal analyses (DTA), differential scanning calorimetry (DSC), tensometric flow method). Due to its good volatility ln(p/p°) = 16.47-9699/T(K) at moderate temperatures (393-414 K) the compound is offered as a promising precursor for growth of Pt films by metal-organic chemical vapour deposition (MOCVD). The Pt films deposited on various substrates including Si(100), Ta, Ti substrates, cathodes and anodes of the electrodes for pacemakers are investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The electrochemical characteristics of Pt films are also determined.
AB - The Me3Pt(acac)Py compound, trimethyl(pentane-2,4-dionato)platinum(IV)pyridine, is synthesized and, for the first time, characterized by physico-chemical methods to determine its chemical composition (elemental analysis, IR-spectroscopy) and thermal behavior (thermogravimetric (TG), differential thermal analyses (DTA), differential scanning calorimetry (DSC), tensometric flow method). Due to its good volatility ln(p/p°) = 16.47-9699/T(K) at moderate temperatures (393-414 K) the compound is offered as a promising precursor for growth of Pt films by metal-organic chemical vapour deposition (MOCVD). The Pt films deposited on various substrates including Si(100), Ta, Ti substrates, cathodes and anodes of the electrodes for pacemakers are investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS). The electrochemical characteristics of Pt films are also determined.
KW - Electrochemical characteristics
KW - MOCVD
KW - Pt films
KW - Pt precursor
KW - Vapour pressure
UR - http://www.scopus.com/inward/record.url?scp=84935729209&partnerID=8YFLogxK
U2 - 10.1002/pssc.201510045
DO - 10.1002/pssc.201510045
M3 - Article
AN - SCOPUS:84935729209
VL - 12
SP - 1053
EP - 1059
JO - Physica Status Solidi (C) Current Topics in Solid State Physics
JF - Physica Status Solidi (C) Current Topics in Solid State Physics
SN - 1862-6351
IS - 7
ER -
ID: 25436237