Research output: Contribution to journal › Article › peer-review
Materials surface smoothing to sub-nanometer level of roughness by argon cluster ion beam. / Korobeishchikov, N. G.; Nikolaev, I. V.; Roenko, M. A.
In: Journal of Physics: Conference Series, Vol. 927, No. 1, 012026, 23.11.2017.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - Materials surface smoothing to sub-nanometer level of roughness by argon cluster ion beam
AU - Korobeishchikov, N. G.
AU - Nikolaev, I. V.
AU - Roenko, M. A.
N1 - Publisher Copyright: © Published under licence by IOP Publishing Ltd.
PY - 2017/11/23
Y1 - 2017/11/23
N2 - In this study, the influence of the accelerated argon cluster ion beam on the topography of stainless steel and optical glass surfaces has been investigated. The possibility of smoothing the material's surface to the sub-nanometer level of roughness is shown. The dose dependencies of the root-mean-square roughness and power spectral density function are obtained. It is demonstrated that by the cluster ion treatment the effective roughness decreases at different ranges of spatial frequencies. Anisotropic structure of the treated material effects on the obtained surface roughness.
AB - In this study, the influence of the accelerated argon cluster ion beam on the topography of stainless steel and optical glass surfaces has been investigated. The possibility of smoothing the material's surface to the sub-nanometer level of roughness is shown. The dose dependencies of the root-mean-square roughness and power spectral density function are obtained. It is demonstrated that by the cluster ion treatment the effective roughness decreases at different ranges of spatial frequencies. Anisotropic structure of the treated material effects on the obtained surface roughness.
UR - http://www.scopus.com/inward/record.url?scp=85037695321&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/927/1/012026
DO - 10.1088/1742-6596/927/1/012026
M3 - Article
AN - SCOPUS:85037695321
VL - 927
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012026
ER -
ID: 9087603