Original languageEnglish
Pages (from-to)1427-1430
Number of pages4
JournalSemiconductors
Volume53
Issue number11
DOIs
Publication statusPublished - 6 Nov 2019

    Research areas

  • defects in silicon, photoluminescence, swift heavy ions, ROOM-TEMPERATURE, PHOTOLUMINESCENCE, DEFECT, RADIATION, ELECTROLUMINESCENCE, DAMAGE, LAYERS

    OECD FOS+WOS

ID: 23568869