• S. G. Cherkova
  • V. A. Volodin
  • V. A. Skuratov
  • M. Stoffel
  • H. Rinnert
  • M. Vergnat
Original languageEnglish
Pages (from-to)633-642
Number of pages10
JournalOptoelectronics, Instrumentation and Data Processing
Volume58
Issue number6
DOIs
Publication statusPublished - 2022

    OECD FOS+WOS

  • 2.02 ELECTRICAL ENG, ELECTRONIC ENG
  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

    Research areas

  • defects in silicon, photoluminescence, swift heavy ions

ID: 55694252