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Invariants of the Reflection Coefficient. / Fedyukhin, L. A.; Gorchakov, A. V.; Kolosovsky, E. A.

In: Optics and Spectroscopy, Vol. 128, No. 2, 01.02.2020, p. 257-263.

Research output: Contribution to journal › Article › peer-review

Harvard

Fedyukhin, LA, Gorchakov, AV & Kolosovsky, EA 2020, 'Invariants of the Reflection Coefficient', Optics and Spectroscopy, vol. 128, no. 2, pp. 257-263. https://doi.org/10.1134/S0030400X20020095

APA

Fedyukhin, L. A., Gorchakov, A. V., & Kolosovsky, E. A. (2020). Invariants of the Reflection Coefficient. Optics and Spectroscopy, 128(2), 257-263. https://doi.org/10.1134/S0030400X20020095

Vancouver

Fedyukhin LA, Gorchakov AV, Kolosovsky EA. Invariants of the Reflection Coefficient. Optics and Spectroscopy. 2020 Feb 1;128(2):257-263. doi: 10.1134/S0030400X20020095

Author

Fedyukhin, L. A. ; Gorchakov, A. V. ; Kolosovsky, E. A. / Invariants of the Reflection Coefficient. In: Optics and Spectroscopy. 2020 ; Vol. 128, No. 2. pp. 257-263.

BibTeX

@article{5b43bf0a4fe94deb90159aa834451fe3,
title = "Invariants of the Reflection Coefficient",
abstract = "The reflection coefficient of a plane monochromatic wave from a three-layer structure is analyzed in detail in the case in which the wave is linearly polarized in the plane of incidence. The inverse ellipsometry problem for a three-layer structure is solved. The occurrence of two invariants of the reflection coefficient for a plane-parallel plate is shown. A set of three measurable parameters is proposed, which have not been used previously, that make it possible to retrieve the material parameters of the layer. Analytical expressions are obtained for the reflection coefficient and the angles of incidence for a number of important particular cases, as well as for the direct calculation of the dielectric permittivity and the layer thickness from the measured values of the observed parameters.",
keywords = "Brewster angle, inverse ellipsometry problem, reflection coefficient invariant, thin films",
author = "Fedyukhin, {L. A.} and Gorchakov, {A. V.} and Kolosovsky, {E. A.}",
year = "2020",
month = feb,
day = "1",
doi = "10.1134/S0030400X20020095",
language = "English",
volume = "128",
pages = "257--263",
journal = "Optics and Spectroscopy (English translation of Optika i Spektroskopiya)",
issn = "0030-400X",
publisher = "Maik Nauka Publishing / Springer SBM",
number = "2",

}

RIS

TY - JOUR

T1 - Invariants of the Reflection Coefficient

AU - Fedyukhin, L. A.

AU - Gorchakov, A. V.

AU - Kolosovsky, E. A.

PY - 2020/2/1

Y1 - 2020/2/1

N2 - The reflection coefficient of a plane monochromatic wave from a three-layer structure is analyzed in detail in the case in which the wave is linearly polarized in the plane of incidence. The inverse ellipsometry problem for a three-layer structure is solved. The occurrence of two invariants of the reflection coefficient for a plane-parallel plate is shown. A set of three measurable parameters is proposed, which have not been used previously, that make it possible to retrieve the material parameters of the layer. Analytical expressions are obtained for the reflection coefficient and the angles of incidence for a number of important particular cases, as well as for the direct calculation of the dielectric permittivity and the layer thickness from the measured values of the observed parameters.

AB - The reflection coefficient of a plane monochromatic wave from a three-layer structure is analyzed in detail in the case in which the wave is linearly polarized in the plane of incidence. The inverse ellipsometry problem for a three-layer structure is solved. The occurrence of two invariants of the reflection coefficient for a plane-parallel plate is shown. A set of three measurable parameters is proposed, which have not been used previously, that make it possible to retrieve the material parameters of the layer. Analytical expressions are obtained for the reflection coefficient and the angles of incidence for a number of important particular cases, as well as for the direct calculation of the dielectric permittivity and the layer thickness from the measured values of the observed parameters.

KW - Brewster angle

KW - inverse ellipsometry problem

KW - reflection coefficient invariant

KW - thin films

UR - http://www.scopus.com/inward/record.url?scp=85083962432&partnerID=8YFLogxK

U2 - 10.1134/S0030400X20020095

DO - 10.1134/S0030400X20020095

M3 - Article

AN - SCOPUS:85083962432

VL - 128

SP - 257

EP - 263

JO - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

JF - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

SN - 0030-400X

IS - 2

ER -

ID: 24231774