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Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions. / Cherkova, S. G.; Volodin, V. A.; Skuratov, V. A. et al.

In: Journal of Luminescence, Vol. 223, 117238, 07.2020.

Research output: Contribution to journal › Article › peer-review

Harvard

Cherkova, SG, Volodin, VA, Skuratov, VA, Stoffel, M, Rinnert, H & Vergnat, M 2020, 'Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions', Journal of Luminescence, vol. 223, 117238. https://doi.org/10.1016/j.jlumin.2020.117238

APA

Cherkova, S. G., Volodin, V. A., Skuratov, V. A., Stoffel, M., Rinnert, H., & Vergnat, M. (2020). Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions. Journal of Luminescence, 223, [117238]. https://doi.org/10.1016/j.jlumin.2020.117238

Vancouver

Cherkova SG, Volodin VA, Skuratov VA, Stoffel M, Rinnert H, Vergnat M. Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions. Journal of Luminescence. 2020 Jul;223:117238. doi: 10.1016/j.jlumin.2020.117238

Author

Cherkova, S. G. ; Volodin, V. A. ; Skuratov, V. A. et al. / Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions. In: Journal of Luminescence. 2020 ; Vol. 223.

BibTeX

@article{c31b169aecde4f518a61da86eed96fb3,
title = "Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions",
abstract = "Germanium silicate suboxide films deposited from GeO/SiO and GeO/SiO2 precursors onto Si(001) substrates using evaporation in high vacuum were modified by swift heavy ions. The films were irradiated by 167 MeV Xe+26 ions with fluences varying from 1011 to 1013 cm−2. We report photoluminescence in the infrared range both at low and at room temperature, which is most probably due to defect-induced radiative transitions in the films.",
keywords = "Defects, Ge and Si oxides, Photoluminescence, Swift heavy ions, FILMS, OXIDE, NANOCRYSTALS",
author = "Cherkova, {S. G.} and Volodin, {V. A.} and Skuratov, {V. A.} and M. Stoffel and H. Rinnert and M. Vergnat",
note = "Publisher Copyright: {\textcopyright} 2020 Elsevier B.V.",
year = "2020",
month = jul,
doi = "10.1016/j.jlumin.2020.117238",
language = "English",
volume = "223",
journal = "Journal of Luminescence",
issn = "0022-2313",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - Infrared photoluminescence from GeO[SiO2] and GeO[SiO] solid alloy layers irradiated with swift heavy Xe ions

AU - Cherkova, S. G.

AU - Volodin, V. A.

AU - Skuratov, V. A.

AU - Stoffel, M.

AU - Rinnert, H.

AU - Vergnat, M.

N1 - Publisher Copyright: © 2020 Elsevier B.V.

PY - 2020/7

Y1 - 2020/7

N2 - Germanium silicate suboxide films deposited from GeO/SiO and GeO/SiO2 precursors onto Si(001) substrates using evaporation in high vacuum were modified by swift heavy ions. The films were irradiated by 167 MeV Xe+26 ions with fluences varying from 1011 to 1013 cm−2. We report photoluminescence in the infrared range both at low and at room temperature, which is most probably due to defect-induced radiative transitions in the films.

AB - Germanium silicate suboxide films deposited from GeO/SiO and GeO/SiO2 precursors onto Si(001) substrates using evaporation in high vacuum were modified by swift heavy ions. The films were irradiated by 167 MeV Xe+26 ions with fluences varying from 1011 to 1013 cm−2. We report photoluminescence in the infrared range both at low and at room temperature, which is most probably due to defect-induced radiative transitions in the films.

KW - Defects

KW - Ge and Si oxides

KW - Photoluminescence

KW - Swift heavy ions

KW - FILMS

KW - OXIDE

KW - NANOCRYSTALS

UR - http://www.scopus.com/inward/record.url?scp=85082387838&partnerID=8YFLogxK

U2 - 10.1016/j.jlumin.2020.117238

DO - 10.1016/j.jlumin.2020.117238

M3 - Article

AN - SCOPUS:85082387838

VL - 223

JO - Journal of Luminescence

JF - Journal of Luminescence

SN - 0022-2313

M1 - 117238

ER -

ID: 23906398