DOI

  • Mayank Dubey
  • Gaurav Siddharth
  • Ruchi Singh
  • Chandrabhan Patel
  • Sanjay Kumar
  • Myo Than Htay
  • Victor V. Atuchin
  • Shaibal Mukherjee
Original languageEnglish
Pages (from-to)2488-2493
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume69
Issue number5
Early online date25 Mar 2022
DOIs
Publication statusPublished - 1 May 2022

    OECD FOS+WOS

  • 2.02.IQ ENGINEERING, ELECTRICAL & ELECTRONIC
  • 1.03.UB PHYSICS, APPLIED

    Research areas

  • Cu-2(Sn,Ge)(S,Se)(3) (CTGSSe), dual-ion beam sputtering (DIBS), substrate temperature, sulfurization, SELENIZATION, FABRICATION, LAYER, Substrate temperature, Sulfurization, Cu (Sn,Ge)(S,Se) (CTGSSe), Dual-ion beam sputtering (DIBS)

ID: 35893877