DOI

  • T. V. Perevalov
  • V. A. Gritsenko
  • A. A. Gismatulin
  • V. A. Voronkovskii
  • A. K. Gerasimova
  • V. Sh Aliev
  • I. A. Prosvirin
Original languageEnglish
Article number264001
Number of pages9
JournalNanotechnology
Volume29
Issue number26
DOIs
Publication statusPublished - 29 Jun 2018

    OECD FOS+WOS

    Research areas

  • charge localization, charge transport, electronic structure, oxygen vacancy, photoelectron spectroscopy, quantumchemistry calculations, THIN-FILMS, TRAP, MECHANISMS, TAOX, OXYGEN VACANCY, quantum-chemistry calculations, CONDUCTION, CRYSTALLINE

ID: 13668229