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Direct analysis of high-purity cadmium by electrothermal vaporization-inductively coupled plasma optical emission spectrometry

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.1016/j.microc.2018.11.014
Final published version

Nickolay S. Medvedev
Olga V. Lundovskaya
Anatoly I. Saprykin

Original language	English
Pages (from-to)	751-755
Number of pages	5
Journal	Microchemical Journal
Volume	145
DOIs	https://doi.org/10.1016/j.microc.2018.11.014
Publication status	Published - 1 Mar 2019

Research areas

Direct analysis of solid samples, Electrothermal vaporization, High-purity cadmium, Inductively coupled plasma, Limits of detection, Optical emission spectrometry, SYSTEM, TUNGSTEN-COIL, GRAPHITE-FURNACE, DIOXIDE, DEVICE, CDTE, TRACE-ELEMENTS, SAMPLE INTRODUCTION, ETV-ICP-AES, MASS SPECTROMETRY

OECD FOS+WOS

ID: 17670133