Determination of Rare Impurities in High-Purity Germanium and Germanium Oxide by Inductively Coupled Plasma Atomic Emission Spectrometry › Research Explorer

DOI

https://doi.org/10.1134/S0020168521040051
Final published version

Original language	English
Pages (from-to)	409-416
Number of pages	8
Journal	Inorganic Materials
Volume	57
Issue number	4
DOIs	https://doi.org/10.1134/S0020168521040051
Publication status	Published - Apr 2021

Research areas

impurity preconcentration, internal standard, semiconductor germanium

OECD FOS+WOS

2.05 MATERIALS ENGINEERING
2.04 CHEMICAL ENGINEERING
1.04 CHEMICAL SCIENCES

ID: 28499839