• D. V. Svitov
  • V. A. Kulikov
  • V. P. Kosykh
Original languageEnglish
Pages (from-to)159-164
Number of pages6
JournalOptoelectronics, Instrumentation and Data Processing
Volume53
Issue number2
DOIs
Publication statusPublished - 1 Mar 2017

    Research areas

  • bag-of-words, search for anomalies, X-ray images

    OECD FOS+WOS

ID: 10185931