Research output: Contribution to journal › Article › peer-review
CPU vs RAM in the Issue of ab initio Simulations of Doped Hafnium Oxide for RRAM and FRAM. / Perevalov, Timofey V.; Islamov, Damir R.
In: Supercomputing Frontiers and Innovations, Vol. 10, No. 3, 2023, p. 18-26.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - CPU vs RAM in the Issue of ab initio Simulations of Doped Hafnium Oxide for RRAM and FRAM
AU - Perevalov, Timofey V.
AU - Islamov, Damir R.
N1 - This work was supported by the Russian Science Foundation, grant No. 22-22-00634. The simulation was performed at the ISP SB RAS cluster. Публикация для корректировки.
PY - 2023
Y1 - 2023
N2 - Atomic and electronic structure of dopped HfO2 is studied using first principle simulations. The 96- and 324-atom supercell are used to simulate impurity density in the range of 2–6.3 mol.% that is used in real electronic memory devices. The optimal spatial configurations of impurity atoms with an oxygen vacancy are found. It is shown that there are no defect levels in the band gap dopped HfO2 with the optimal structures. The electronic structure of additional neutral oxygen vacancy in HfO2 is equivalent to that of neutral oxygen vacancy in pure HfO2. An increase in the size of a supercell predictably leads to an increase in the need for computing resources. At the same time, the need for RAM is growing faster than for CPU power. Doping HfO2 with Al/La/Y with concentration of up to 6.2 mol.% has negligible effect on the electronic structure of neutral oxygen vacancies.
AB - Atomic and electronic structure of dopped HfO2 is studied using first principle simulations. The 96- and 324-atom supercell are used to simulate impurity density in the range of 2–6.3 mol.% that is used in real electronic memory devices. The optimal spatial configurations of impurity atoms with an oxygen vacancy are found. It is shown that there are no defect levels in the band gap dopped HfO2 with the optimal structures. The electronic structure of additional neutral oxygen vacancy in HfO2 is equivalent to that of neutral oxygen vacancy in pure HfO2. An increase in the size of a supercell predictably leads to an increase in the need for computing resources. At the same time, the need for RAM is growing faster than for CPU power. Doping HfO2 with Al/La/Y with concentration of up to 6.2 mol.% has negligible effect on the electronic structure of neutral oxygen vacancies.
KW - high performance computing
KW - memristor
KW - paradigm of structural calculations
KW - parallelism
KW - quantum chemistry
KW - supercomputer
UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85185183754&origin=inward&txGid=f46a9ba5da79e6fae12cc439224949d1
UR - https://www.mendeley.com/catalogue/42084979-3ef2-3d29-90a2-1733e1f3eaf7/
U2 - 10.14529/JSFI230303
DO - 10.14529/JSFI230303
M3 - Article
VL - 10
SP - 18
EP - 26
JO - Supercomputing Frontiers and Innovations
JF - Supercomputing Frontiers and Innovations
SN - 2409-6008
IS - 3
ER -
ID: 59772531