Consideration of the Sample Eccentricity in the Measurement of Unit Cell Parameters of Small Single Crystals in Bond’s Scheme Implemented in Modern Diffractometers

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	2466-2477
Number of pages	12
Journal	Journal of Structural Chemistry
Volume	65
Issue number	12
DOIs	https://doi.org/10.1134/S0022476624120102
Publication status	Published - 27 Dec 2024

2D detector, accuracy, Bond’s scheme, eccentricity, reference, single crystal X-ray diffraction, small crystals, unit cell parameters

ID: 61415761