Standard

Calibration procedure in microchannel amplifiers design. / Ivanov, V.; Barnyakov, A.; Barnyakov, M.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 903, 21.09.2018, p. 170-174.

Research output: Contribution to journal › Article › peer-review

Harvard

Ivanov, V, Barnyakov, A & Barnyakov, M 2018, 'Calibration procedure in microchannel amplifiers design', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 903, pp. 170-174. https://doi.org/10.1016/j.nima.2018.05.046

APA

Ivanov, V., Barnyakov, A., & Barnyakov, M. (2018). Calibration procedure in microchannel amplifiers design. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 903, 170-174. https://doi.org/10.1016/j.nima.2018.05.046

Vancouver

Ivanov V, Barnyakov A, Barnyakov M. Calibration procedure in microchannel amplifiers design. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2018 Sept 21;903:170-174. doi: 10.1016/j.nima.2018.05.046

Author

Ivanov, V. ; Barnyakov, A. ; Barnyakov, M. / Calibration procedure in microchannel amplifiers design. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2018 ; Vol. 903. pp. 170-174.

BibTeX

@article{9b6c58a1514a4c149e809e17834588ae,
title = "Calibration procedure in microchannel amplifiers design",
abstract = "The main parameters of microchannel amplifiers – angular and energy distributions of photo- and secondary-electron emission – are determined by the emission properties of materials. These parameters depend on the type of materials, the thickness of deposited films and the technology of processing their surfaces. Data on the emission properties of materials can be obtained by means of experimental measurements or by calculation methods using molecular dynamics. In both cases, this is associated with significant resource costs. In the cases where some of these characteristics of the materials are unknown, a calibration procedure can be recommended to determine them. Details of this procedure are described in this paper. Comparison of numerical and experimental data for specific devices is performed.",
keywords = "Microchannel plate, Numerical simulation, Photo detector",
author = "V. Ivanov and A. Barnyakov and M. Barnyakov",
year = "2018",
month = sep,
day = "21",
doi = "10.1016/j.nima.2018.05.046",
language = "English",
volume = "903",
pages = "170--174",
journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier Science B.V.",

}

RIS

TY - JOUR

T1 - Calibration procedure in microchannel amplifiers design

AU - Ivanov, V.

AU - Barnyakov, A.

AU - Barnyakov, M.

PY - 2018/9/21

Y1 - 2018/9/21

N2 - The main parameters of microchannel amplifiers – angular and energy distributions of photo- and secondary-electron emission – are determined by the emission properties of materials. These parameters depend on the type of materials, the thickness of deposited films and the technology of processing their surfaces. Data on the emission properties of materials can be obtained by means of experimental measurements or by calculation methods using molecular dynamics. In both cases, this is associated with significant resource costs. In the cases where some of these characteristics of the materials are unknown, a calibration procedure can be recommended to determine them. Details of this procedure are described in this paper. Comparison of numerical and experimental data for specific devices is performed.

AB - The main parameters of microchannel amplifiers – angular and energy distributions of photo- and secondary-electron emission – are determined by the emission properties of materials. These parameters depend on the type of materials, the thickness of deposited films and the technology of processing their surfaces. Data on the emission properties of materials can be obtained by means of experimental measurements or by calculation methods using molecular dynamics. In both cases, this is associated with significant resource costs. In the cases where some of these characteristics of the materials are unknown, a calibration procedure can be recommended to determine them. Details of this procedure are described in this paper. Comparison of numerical and experimental data for specific devices is performed.

KW - Microchannel plate

KW - Numerical simulation

KW - Photo detector

UR - http://www.scopus.com/inward/record.url?scp=85049738397&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2018.05.046

DO - 10.1016/j.nima.2018.05.046

M3 - Article

AN - SCOPUS:85049738397

VL - 903

SP - 170

EP - 174

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

ER -

ID: 14481943