Calculation of the object edge position after its projection in a spatially noninvariant coherent optical system

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Calculation of the object edge position after its projection in a spatially noninvariant coherent optical system. / Chugui, Yu V.

In: Optoelectronics, Instrumentation and Data Processing, Vol. 52, No. 6, 01.11.2016, p. 570-579.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{74d2861ed953498695c2bb200ec564bd,

title = "Calculation of the object edge position after its projection in a spatially noninvariant coherent optical system",

abstract = "Specific features of half-plane image formation in a spatially noninvariant (aberration-free) coherent optical system of the 2F–2F telecentric type with a limited aperture of the projection objective (in the absence of the spatial frequency filter) are studied. The dependence of the light intensity behavior at a point corresponding to the half-plane edge in the image on the object position is found in an analytical form on the basis of approximating the Fresnel functions by analytical functions. As the half-plane approaches the boundary of the field of vision of the system determined by the objective aperture diameter, the light intensity is demonstrated to deviate significantly from that in the case of the axial position of the half-plane, which may lead to noticeable measurement errors in inspecting the geometric parameters of objects by the projection method in transmitted light.",

keywords = "dimensional inspection, Fourier optics, light diffraction, telecentric projection systems",

author = "Chugui, {Yu V.}",

year = "2016",

month = nov,

day = "1",

doi = "10.3103/S8756699016060078",

language = "English",

volume = "52",

pages = "570--579",

journal = "Optoelectronics, Instrumentation and Data Processing",

issn = "8756-6990",

publisher = "Allerton Press Inc.",

number = "6",

}

RIS

TY - JOUR

T1 - Calculation of the object edge position after its projection in a spatially noninvariant coherent optical system

AU - Chugui, Yu V.

PY - 2016/11/1

Y1 - 2016/11/1

N2 - Specific features of half-plane image formation in a spatially noninvariant (aberration-free) coherent optical system of the 2F–2F telecentric type with a limited aperture of the projection objective (in the absence of the spatial frequency filter) are studied. The dependence of the light intensity behavior at a point corresponding to the half-plane edge in the image on the object position is found in an analytical form on the basis of approximating the Fresnel functions by analytical functions. As the half-plane approaches the boundary of the field of vision of the system determined by the objective aperture diameter, the light intensity is demonstrated to deviate significantly from that in the case of the axial position of the half-plane, which may lead to noticeable measurement errors in inspecting the geometric parameters of objects by the projection method in transmitted light.

AB - Specific features of half-plane image formation in a spatially noninvariant (aberration-free) coherent optical system of the 2F–2F telecentric type with a limited aperture of the projection objective (in the absence of the spatial frequency filter) are studied. The dependence of the light intensity behavior at a point corresponding to the half-plane edge in the image on the object position is found in an analytical form on the basis of approximating the Fresnel functions by analytical functions. As the half-plane approaches the boundary of the field of vision of the system determined by the objective aperture diameter, the light intensity is demonstrated to deviate significantly from that in the case of the axial position of the half-plane, which may lead to noticeable measurement errors in inspecting the geometric parameters of objects by the projection method in transmitted light.

KW - dimensional inspection

KW - Fourier optics

KW - light diffraction

KW - telecentric projection systems

UR - http://www.scopus.com/inward/record.url?scp=85013328729&partnerID=8YFLogxK

U2 - 10.3103/S8756699016060078

DO - 10.3103/S8756699016060078

M3 - Article

AN - SCOPUS:85013328729

VL - 52

SP - 570

EP - 579

JO - Optoelectronics, Instrumentation and Data Processing

JF - Optoelectronics, Instrumentation and Data Processing

SN - 8756-6990

IS - 6

ER -

ID: 25331609