Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
Original language | English |
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Title of host publication | Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI |
Editors | SM Shahriar, J Scheuer |
Publisher | SPIE |
Number of pages | 6 |
Volume | 10548 |
ISBN (Electronic) | 9781510615816 |
DOIs | |
Publication status | Published - 1 Jan 2018 |
Event | Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI 2018 - San Francisco, United States Duration: 29 Jan 2018 → 1 Feb 2018 |
Name | Proceedings of SPIE |
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Publisher | SPIE-INT SOC OPTICAL ENGINEERING |
Volume | 10548 |
ISSN (Print) | 0277-786X |
Conference | Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI 2018 |
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Country/Territory | United States |
City | San Francisco |
Period | 29.01.2018 → 01.02.2018 |
ID: 14870474