Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review
| Original language | English |
|---|---|
| Title of host publication | Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI |
| Editors | SM Shahriar, J Scheuer |
| Publisher | The International Society for Optical Engineering |
| Pages | 71 |
| Number of pages | 6 |
| Volume | 10548 |
| ISBN (Electronic) | 9781510615816 |
| ISBN (Print) | 9781510615816 |
| DOIs | |
| Publication status | Published - 1 Jan 2018 |
| Event | Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI 2018 - San Francisco, United States Duration: 29 Jan 2018 → 1 Feb 2018 Conference number: 11 |
| Name | Proceedings of SPIE |
|---|---|
| Publisher | SPIE-INT SOC OPTICAL ENGINEERING |
| Volume | 10548 |
| ISSN (Print) | 0277-786X |
| Conference | Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI 2018 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 29.01.2018 → 01.02.2018 |
ID: 14870474