DOI

Original languageEnglish
Title of host publicationSteep Dispersion Engineering and Opto-Atomic Precision Metrology XI
EditorsSM Shahriar, J Scheuer
PublisherSPIE
Number of pages6
Volume10548
ISBN (Electronic)9781510615816
DOIs
Publication statusPublished - 1 Jan 2018
EventSteep Dispersion Engineering and Opto-Atomic Precision Metrology XI 2018 - San Francisco, United States
Duration: 29 Jan 20181 Feb 2018

Publication series

NameProceedings of SPIE
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume10548
ISSN (Print)0277-786X

Conference

ConferenceSteep Dispersion Engineering and Opto-Atomic Precision Metrology XI 2018
Country/TerritoryUnited States
CitySan Francisco
Period29.01.201801.02.2018

    Research areas

  • anti-relaxation coating, atomic clock, coherent population trapping resonance, Rubidium cell, VAPOR, OPTIMIZATION, FREQUENCY-MODULATION PARAMETERS, RB-87

ID: 14870474