Standard

An optical method for determination of the mass thickness of thin gold films with arbitrary morphology. / Starinskiy, Sergey V.; Safonov, Alexey I.; Sulyaeva, Veronica S. et al.

In: Thin Solid Films, Vol. 714, 138392, 30.11.2020.

Research output: Contribution to journal › Article › peer-review

Harvard

Starinskiy, SV, Safonov, AI, Sulyaeva, VS, Rodionov, AA, Shukhov, YG & Bulgakov, AV 2020, 'An optical method for determination of the mass thickness of thin gold films with arbitrary morphology', Thin Solid Films, vol. 714, 138392. https://doi.org/10.1016/j.tsf.2020.138392

APA

Starinskiy, S. V., Safonov, A. I., Sulyaeva, V. S., Rodionov, A. A., Shukhov, Y. G., & Bulgakov, A. V. (2020). An optical method for determination of the mass thickness of thin gold films with arbitrary morphology. Thin Solid Films, 714, [138392]. https://doi.org/10.1016/j.tsf.2020.138392

Vancouver

Starinskiy SV, Safonov AI, Sulyaeva VS, Rodionov AA, Shukhov YG, Bulgakov AV. An optical method for determination of the mass thickness of thin gold films with arbitrary morphology. Thin Solid Films. 2020 Nov 30;714:138392. doi: 10.1016/j.tsf.2020.138392

Author

Starinskiy, Sergey V. ; Safonov, Alexey I. ; Sulyaeva, Veronica S. et al. / An optical method for determination of the mass thickness of thin gold films with arbitrary morphology. In: Thin Solid Films. 2020 ; Vol. 714.

BibTeX

@article{20e9ded82d6d483bb6486f1993b33849,
title = "An optical method for determination of the mass thickness of thin gold films with arbitrary morphology",
abstract = "The mass thickness of thin metal films is an important parameter determining the film structure, however a robust routine method for its determination is still missing. In this work, we have developed a simple optical method for determining the mass thickness of gold films with arbitrary morphology on transparent substrates in the range 1–20 nm. The method is based on film spectrophotometry in the far-UV range when the light attenuation is due to interaction with core electrons and thus the influence of the film morphology is negligible. The calibration was performed at a wavelength of 200 nm for gold films of known thickness and a good agreement with the Beer–Lambert law was obtained. The feasibility of the method was demonstrated with gold films of various morphologies produced on quartz substrates by pulsed laser deposition.",
keywords = "Film thickness, Gold, Laser deposition, Nanosecond laser, Nanostructures, Thin film, VACUUM, PULSED-LASER ABLATION, DEPOSITION, SILICON, NOBLE, PLASMONIC PROPERTIES, NANOPARTICLES, GROWTH, REFRACTIVE-INDEX, NUCLEATION",
author = "Starinskiy, {Sergey V.} and Safonov, {Alexey I.} and Sulyaeva, {Veronica S.} and Rodionov, {Alexey A.} and Shukhov, {Yuri G.} and Bulgakov, {Alexander V.}",
note = "Publisher Copyright: {\textcopyright} 2020 Elsevier B.V.",
year = "2020",
month = nov,
day = "30",
doi = "10.1016/j.tsf.2020.138392",
language = "English",
volume = "714",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier",

}

RIS

TY - JOUR

T1 - An optical method for determination of the mass thickness of thin gold films with arbitrary morphology

AU - Starinskiy, Sergey V.

AU - Safonov, Alexey I.

AU - Sulyaeva, Veronica S.

AU - Rodionov, Alexey A.

AU - Shukhov, Yuri G.

AU - Bulgakov, Alexander V.

N1 - Publisher Copyright: © 2020 Elsevier B.V.

PY - 2020/11/30

Y1 - 2020/11/30

N2 - The mass thickness of thin metal films is an important parameter determining the film structure, however a robust routine method for its determination is still missing. In this work, we have developed a simple optical method for determining the mass thickness of gold films with arbitrary morphology on transparent substrates in the range 1–20 nm. The method is based on film spectrophotometry in the far-UV range when the light attenuation is due to interaction with core electrons and thus the influence of the film morphology is negligible. The calibration was performed at a wavelength of 200 nm for gold films of known thickness and a good agreement with the Beer–Lambert law was obtained. The feasibility of the method was demonstrated with gold films of various morphologies produced on quartz substrates by pulsed laser deposition.

AB - The mass thickness of thin metal films is an important parameter determining the film structure, however a robust routine method for its determination is still missing. In this work, we have developed a simple optical method for determining the mass thickness of gold films with arbitrary morphology on transparent substrates in the range 1–20 nm. The method is based on film spectrophotometry in the far-UV range when the light attenuation is due to interaction with core electrons and thus the influence of the film morphology is negligible. The calibration was performed at a wavelength of 200 nm for gold films of known thickness and a good agreement with the Beer–Lambert law was obtained. The feasibility of the method was demonstrated with gold films of various morphologies produced on quartz substrates by pulsed laser deposition.

KW - Film thickness

KW - Gold

KW - Laser deposition

KW - Nanosecond laser

KW - Nanostructures

KW - Thin film

KW - VACUUM

KW - PULSED-LASER ABLATION

KW - DEPOSITION

KW - SILICON

KW - NOBLE

KW - PLASMONIC PROPERTIES

KW - NANOPARTICLES

KW - GROWTH

KW - REFRACTIVE-INDEX

KW - NUCLEATION

UR - http://www.scopus.com/inward/record.url?scp=85092444371&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2020.138392

DO - 10.1016/j.tsf.2020.138392

M3 - Article

AN - SCOPUS:85092444371

VL - 714

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

M1 - 138392

ER -

ID: 25688557