Research output: Contribution to journal › Article › peer-review
A Study of the Crystal Structure of Co40Fe40B20 Epitaxial Films on a Bi2Te3 Topological Insulator. / Kaveev, A. K.; Suturin, S. M.; Sokolov, N. S. et al.
In: Technical Physics Letters, Vol. 44, No. 3, 01.03.2018, p. 184-186.Research output: Contribution to journal › Article › peer-review
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TY - JOUR
T1 - A Study of the Crystal Structure of Co40Fe40B20 Epitaxial Films on a Bi2Te3 Topological Insulator
AU - Kaveev, A. K.
AU - Suturin, S. M.
AU - Sokolov, N. S.
AU - Kokh, K. A.
AU - Tereshchenko, O. E.
N1 - Publisher Copyright: © 2018, Pleiades Publishing, Ltd.
PY - 2018/3/1
Y1 - 2018/3/1
N2 - Laser molecular-beam epitaxy has been used to form Co40Fe40B20 layers on Bi2Te3 topological insulator substrates, and their growth conditions have been studied. The possibility of growing epitaxial ferromagnetic layers on the surface of a topological insulator is demonstrated for the first time. The CoFeB layers have a body-centered cubic crystal structure with the (111) crystal plane parallel to the (0001) plane of Bi2Te3. 3D mapping in the reciprocal space of high-energy electron-diffraction patterns made it possible to determine the epitaxial relationships between the film and the substrate.
AB - Laser molecular-beam epitaxy has been used to form Co40Fe40B20 layers on Bi2Te3 topological insulator substrates, and their growth conditions have been studied. The possibility of growing epitaxial ferromagnetic layers on the surface of a topological insulator is demonstrated for the first time. The CoFeB layers have a body-centered cubic crystal structure with the (111) crystal plane parallel to the (0001) plane of Bi2Te3. 3D mapping in the reciprocal space of high-energy electron-diffraction patterns made it possible to determine the epitaxial relationships between the film and the substrate.
UR - http://www.scopus.com/inward/record.url?scp=85045644408&partnerID=8YFLogxK
U2 - 10.1134/S1063785018030082
DO - 10.1134/S1063785018030082
M3 - Article
AN - SCOPUS:85045644408
VL - 44
SP - 184
EP - 186
JO - Technical Physics Letters
JF - Technical Physics Letters
SN - 1063-7850
IS - 3
ER -
ID: 12690761