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  1. 2024

  2. Surface morphology analysis of CdTe buffer layers using ellipsometry and interference profilometry to create a technique for monitoring the growth of buffer layers

    Shvets, V. A., Marin, D. V., Kuznetsova, L. S., Azarov, I. A., Yakushev, M. V. & Rykhlitskii, S. V., 20 Jul 2024, In: Journal of Optical Technology (A Translation of Opticheskii Zhurnal). 91, 2, p. 91-95 5 p., 6.

    Research output: Contribution to journal › Article › peer-review

  3. Methyl Methacrylate Copolymer with Pendant Thioxanthenone Groups as Active Layer for Resistive Memory Devices

    Odintsov, D. S., Gismatulin, A. A., Shundrina, I. K., Buktoyarova, A. D., Os'kina, I. A., Beckmann, J., Azarov, I. A., Dementeva, E. V., Shundrin, L. A. & Gritsenko, V. A., 4 Nov 2024, In: ChemPhysChem. 25, 21, p. e202400266 e202400266.

    Research output: Contribution to journal › Article › peer-review

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