1. 2017
  2. Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes

    Azarov, I. A., Shvets, V. A., Dulin, S. A., Mikhailov, N. N., Dvoretskii, S. A., Ikusov, D. G., Uzhakov, I. N. & Rykhlitskii, S. V., 1 Nov 2017, In: Optoelectronics, Instrumentation and Data Processing. 53, 6, p. 630-638 9 p.

    Research output: Contribution to journalArticlepeer-review

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