1. 2025
  2. Development of Detectors for Station 1–3 “Fast Processes” of the SKIF Center for Collective Use

    Shekhtman, L. I., Aulchenko, V. M., Burdin, V. E., Glushak, A. A., Kornievsky, M. A., Kudryavtsev, V. N., Titov, V. M., Tolbanov, O. P., Tyazhev, A. V., Zarubin, A. N. & Zhulanov, V. V., 17 Jan 2025, In: Bulletin of the Russian Academy of Sciences: Physics. 88, Suppl 1, p. S105-S115 11 p.

    Research output: Contribution to journalArticlepeer-review

  3. Fast Synchrotron Radiation beam Position and Intensity Monitor for the Experiments to Study Fast-Flowing Processes

    Aulchenko, V. M., Glushak, A. A., Kornievsky, M. A., Shekhtman, L. I., Tolbanov, O. P., Tyazhev, A. V. & Zarubin, A. N., 17 Jan 2025, In: Bulletin of the Russian Academy of Sciences: Physics. 88, Suppl 1, p. S116-S121 6 p.

    Research output: Contribution to journalArticlepeer-review

  4. 2024
  5. Specialized Integrated Circuit for Coordinate Counting Detectors

    Glushak, A. A., Aulchenko, V. M., Zhulanov, V. V. & Shekhtman, L. I., 30 Jun 2024, In: Optoelectronics, Instrumentation and Data Processing. 60, 1, p. 99-105 7 p.

    Research output: Contribution to journalArticlepeer-review

  6. Control Electronics for One-Coordinate X-Ray Detectors

    Yartseva, M. A., Glushak, A. A., Shekhtman, L. I., Titov, V. M., Petrenko, P. V. & Zhulanov, V. V., 2024, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 910-913 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  7. Jet Density Dynamics During Shock Impact on Metal Plate Joints

    Khalemenchuk, V. P., Glushak, A. A., Rubtsov, I. A., Ten, K. A., Pruuel, E. R. & Kashkarov, A. O., 2024, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 950-953 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  8. 2023
  9. Silicon Microstrip Detector for Studying Fast Processes on a Synchrotron Beam

    Aulchenko, V. M., Glushak, A. A., Zhulanov, V. V., Zhuravlev, A. N., Kiselev, V. A., Kudryavtsev, V. N., Piminov, P. A., Titov, V. M. & Shekhtman, L. I., Dec 2023, In: Journal of Surface Investigation. 17, 6, p. 1356-1363 8 p.

    Research output: Contribution to journalArticlepeer-review

  10. Development of a One-Dimensional Detector for Diffraction Experiments at the Synchrotron Radiation Beam

    Aulchenko, V. M., Glushak, A. A., Zhulanov, V. V., Titov, V. M. & Shekhtman, L. I., Aug 2023, In: Journal of Surface Investigation. 17, 4, p. 892-897 6 p.

    Research output: Contribution to journalArticlepeer-review

  11. Development of One-Coordinate Detector for Diffraction Experiments at a SynchrotronRadiation Beam

    Aulchenko, V. M., Glushak, A. A., Zhulanov, V. V., Shekhtman, L. I. & Titov, V. M., 2023, 24th IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2023; Novosibirsk; Russian Federation; 29 June 2023 до 3 July 2023. IEEE Computer Society, 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  12. Development of Specialized Integrated Circuits for Coordinate X-Ray Detectors

    Glushak, A. A., Aulchenko, V. M., Shekhtman, L. I. & Zhulanov, V. V., 2023, Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), p. 50-53 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

  13. Single-Bunch Monitor of the Position and Intensity of the SR Beam for Station "Fast Processes" of the Synchrotron Radiation Facility "SKIF"

    Kornievskiy, M. A., Aulchenko, V. M., Glushak, A. A. & Shekhtman, L. I., 2023, Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), p. 900-905 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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