Utilizing Lexicographic Resources for Sentiment Classification in Uzbek Language

Mengliev, D. B., Akhmedov, E. Y., Barakhnin, V. B., Hakimov, Z. A. & Alloyorov, O. M., 2023, Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers Inc., p. 1720-1724 5 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Using Partial Models to Extract Emotional Estimations from Natural Language Texts

Akhmedov, E. Y. & Palchunov, D. E., 26 Nov 2024, 2024 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2024. Institute of Electrical and Electronics Engineers Inc., p. 282-287 6 p. (2024 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2024).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Using Machine Learning Methods to Model and Interpret Problems in Determining the Parameters of the Medium Near the Well Using Signals from a High-Frequency Induction Logging While Drilling Device

Vlasov, A., Al Masud, R. & Bykova, G., 18 Nov 2025, 2025 IEEE XVII International Scientific and Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE). Institute of Electrical and Electronics Engineers Inc., p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Using Few-Shot Learning Techniques for Named Entity Recognition and Relation Extraction

Bondarenko, I., Berezin, S., Pauls, A., Batura, T., Rubtsova, Y. & Tuchinov, B., 14 Nov 2020, Proceedings - 2020 Science and Artificial Intelligence Conference, S.A.I.ence 2020. Novosibirsk, Russia: Institute of Electrical and Electronics Engineers Inc., p. 58-65 8 p. 9303192. (Proceedings - 2020 Science and Artificial Intelligence Conference, S.A.I.ence 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Using Algorithmic Complexity Metrics for Process-Oriented Specifications

Abramenko, A. & Zyubin, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1430-1434 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

Unsupervised Anomaly Detection on Distributed Log Tracing through Deep Learning

Khudyakov, D. A. & Yakhyaeva, G. E., 2024, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1830-1833 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review