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  1. 2025

  2. Fast Adaptive Approximate Nearest Neighbor Search with Cluster-Shaped Indices

    Kazakovtsev, V., Плеханов, М. С., Naumchev, A., Shkaberina, G., Masich, I., Egorova, L., Stupina, A., Popov, A. & Kazakovtsev, L., 9 Oct 2025, In: Big Data and Cognitive Computing. 9, 10, 254.

    Research output: Contribution to journal › Article › peer-review

  3. Development of a hybrid algorithm for identifying named entities in 20th century Uzbek texts

    Mengliev, D., Abdurakhmonova, N., Allamov, O., Ibragimov, B., Saidov, B. & Boltayev, N., 15 Sept 2025, AIP Conference Proceedings. American Institute of Physics Inc., Vol. 3356. 050002. (AIP Conference Proceedings; vol. 3356).

    Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research › peer-review

  4. Evolution of Accelerator Based Neutron Source VITA

    Bikchurina, M. I., Bykov, T. A., Verkhovod, G. D., Degtyarev, V. S., Kasatov, D. A., Kashcheev, A. A., Kolesnikov, Y. A., Konovalova, V. D., Koshkarev, A. M., Kuznetsov, A. S., Ostreinov, G. M., Savinov, S. S., Singatulina, N. S., Sokolova, E. A., Soldatov, A. E., Sorokin, I. N., Shein, T. V., Shuklina, A. A., Shchudlo, I. M. & Taskaev, S. Y., 11 Aug 2025, In: Physics of Particles and Nuclei Letters. 22, 4, p. 807-810 4 p.

    Research output: Contribution to journal › Article › peer-review

  5. Development of a Personalized Recommendation System with High Data Protection

    Palchunova, O., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1830-1833 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  6. Prediction of Anxiety Levels Based on Spatial-Frequency Patterns of EEG Activity During Perception of Another Person's Face

    Lozhnikov, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1850-1853 4 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  7. Semi-Automated Framework for Feature Engineering in Machine Learning and Data Analysis

    Radeev, N. & Vinogradova, K., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1520-1525 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  8. Towards Verification Reflex Programs in the Rodin Platform

    Shabanova, M. & Garanina, N., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1490-1495 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  9. Using Algorithmic Complexity Metrics for Process-Oriented Specifications

    Abramenko, A. & Zyubin, V., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1430-1434 5 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  10. Verification Condition Generator for Revised Reflex Language Using Isabelle/HOL

    Ищенко, А. Д. & Ануреев, И. С., 8 Aug 2025, International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, p. 1440-1445 6 p. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Research › peer-review

  11. Transcriptomic Profile of the Trastuzumab-Resistant Breast Cancer Cell Line BT-474

    Shifon, S. A., Karpets, I. O., Chesnokova, A. S., Karitskaya, P. E., Ukladov, E. O., Evgenov, I. V., Sidorov, S. V. & Gulyaeva, L. F., Aug 2025, In: Molecular Biology. 59, 4, p. 508-521 14 p., 4.

    Research output: Contribution to journal › Article › peer-review

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