Standard

X-Ray Certification of Si, Ge, LaB6, and InSb Single Crystals. / Serebrennikova, P. S.; Gromilov, S. A.

в: Journal of Structural Chemistry, Том 66, № 7, 15, 07.2025, стр. 1527-1536.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Vancouver

Serebrennikova PS, Gromilov SA. X-Ray Certification of Si, Ge, LaB6, and InSb Single Crystals. Journal of Structural Chemistry. 2025 июль;66(7):1527-1536. 15. doi: 10.1134/S0022476625070157

Author

Serebrennikova, P. S. ; Gromilov, S. A. / X-Ray Certification of Si, Ge, LaB6, and InSb Single Crystals. в: Journal of Structural Chemistry. 2025 ; Том 66, № 7. стр. 1527-1536.

BibTeX

@article{cc53b73f08424262ba77db66bc395e00,
title = "X-Ray Certification of Si, Ge, LaB6, and InSb Single Crystals",
abstract = "We report an X-ray certification of a series of new X-ray standard (Si, Ge, LaB6, InSb) in the form of 20-50 µm large perfect high-purity single crystals. The unit cell parameters of the studied single crystals are measured using a Si single crystal (a = 5.431042 {\AA}) as an external reference that was earlier studied on a single-crystal spectrometer using Bond′s scheme. It is shown that the relative accuracy of the obtained cubic unit cell parameters Δa/a is at least 5·10–5 provided that eccentricity was taken into account properly. The cubic unit cell parameter of the Y2O3 single crystal is refined using Ge and InSb standards.",
keywords = "2D detector, X-ray diffractometry, eccentricity, precision, small crystals, standard reference material, unit cell parameters",
author = "Serebrennikova, {P. S.} and Gromilov, {S. A.}",
note = "This study was supported by the Russian Science Foundation and the Government of the Novosibirsk region (project No. 24-22-20017, https://rscf.ru/project/24-22-20017/).",
year = "2025",
month = jul,
doi = "10.1134/S0022476625070157",
language = "English",
volume = "66",
pages = "1527--1536",
journal = "Journal of Structural Chemistry",
issn = "0022-4766",
publisher = "Springer",
number = "7",

}

RIS

TY - JOUR

T1 - X-Ray Certification of Si, Ge, LaB6, and InSb Single Crystals

AU - Serebrennikova, P. S.

AU - Gromilov, S. A.

N1 - This study was supported by the Russian Science Foundation and the Government of the Novosibirsk region (project No. 24-22-20017, https://rscf.ru/project/24-22-20017/).

PY - 2025/7

Y1 - 2025/7

N2 - We report an X-ray certification of a series of new X-ray standard (Si, Ge, LaB6, InSb) in the form of 20-50 µm large perfect high-purity single crystals. The unit cell parameters of the studied single crystals are measured using a Si single crystal (a = 5.431042 Å) as an external reference that was earlier studied on a single-crystal spectrometer using Bond′s scheme. It is shown that the relative accuracy of the obtained cubic unit cell parameters Δa/a is at least 5·10–5 provided that eccentricity was taken into account properly. The cubic unit cell parameter of the Y2O3 single crystal is refined using Ge and InSb standards.

AB - We report an X-ray certification of a series of new X-ray standard (Si, Ge, LaB6, InSb) in the form of 20-50 µm large perfect high-purity single crystals. The unit cell parameters of the studied single crystals are measured using a Si single crystal (a = 5.431042 Å) as an external reference that was earlier studied on a single-crystal spectrometer using Bond′s scheme. It is shown that the relative accuracy of the obtained cubic unit cell parameters Δa/a is at least 5·10–5 provided that eccentricity was taken into account properly. The cubic unit cell parameter of the Y2O3 single crystal is refined using Ge and InSb standards.

KW - 2D detector

KW - X-ray diffractometry

KW - eccentricity

KW - precision

KW - small crystals

KW - standard reference material

KW - unit cell parameters

UR - https://www.scopus.com/pages/publications/105012600564

UR - https://www.elibrary.ru/item.asp?id=82649100

UR - https://www.mendeley.com/catalogue/0e6d20ee-f106-387c-b800-5951536ae62e/

U2 - 10.1134/S0022476625070157

DO - 10.1134/S0022476625070157

M3 - Article

VL - 66

SP - 1527

EP - 1536

JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

IS - 7

M1 - 15

ER -

ID: 68731859