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Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder. / Zorina, Kseniya; Kriveckiy, Andrey; Klemeshova, Darya и др.

International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. стр. 1790-1793 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаяРецензирование

Harvard

Zorina, K, Kriveckiy, A, Klemeshova, D, Bocharov, A & Karmanov, V 2025, Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder. в International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, IEEE Computer Society, стр. 1790-1793, 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), Алтай, Российская Федерация, 27.06.2025. https://doi.org/10.1109/EDM65517.2025.11096763

APA

Zorina, K., Kriveckiy, A., Klemeshova, D., Bocharov, A., & Karmanov, V. (2025). Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder. в International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM (стр. 1790-1793). (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). IEEE Computer Society. https://doi.org/10.1109/EDM65517.2025.11096763

Vancouver

Zorina K, Kriveckiy A, Klemeshova D, Bocharov A, Karmanov V. Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder. в International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society. 2025. стр. 1790-1793. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). doi: 10.1109/EDM65517.2025.11096763

Author

Zorina, Kseniya ; Kriveckiy, Andrey ; Klemeshova, Darya и др. / Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. стр. 1790-1793 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

BibTeX

@inproceedings{2250153d1d2343f683d0ee5fad2be691,
title = "Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder",
abstract = "Depression is one of the most common mental disorders. Therefore, the development of new methods for early diagnosis of depression is a highly relevant task. It is well known that depression has both a genetic predisposition and greatly depends on the patient's life background. Therefore, the analysis of only genetic markers of depression is usually unsuccessful, because it does not take into account the physiological state of a person at the time of examination. The aim of our study was to develop an algorithm for the joint analysis of a collection of genetic and neurophysiological data collected from healthy people and patients with depression to identify genetic markers and neurophysiological correlates of pathology. As EEG indicators, we considered the amplitudes of evoked potentials under the conditions of performing tasks in the stop-signal paradigm. We applied machine learning algorithms that allow us to identify single nucleotide polymorphisms associated with the risk of depression.",
keywords = "EEG, analysis of variance (ANOVA), depressive disorder, event-related potentials (ERPs), genetic markers, machine learning, singlenucleotide polymorphisms (SNPs), stopsignal paradigm (SSP)",
author = "Kseniya Zorina and Andrey Kriveckiy and Darya Klemeshova and Andrey Bocharov and Vitaliy Karmanov",
note = "The collection and analysis of genetic data was performed within the budget project of the ICG SB RAS No. FWNR-2022- 0020.; 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM), EDM 2025 ; Conference date: 27-06-2025 Through 01-07-2025",
year = "2025",
month = aug,
day = "8",
doi = "10.1109/EDM65517.2025.11096763",
language = "English",
isbn = "9781665477376",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "1790--1793",
booktitle = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
address = "United States",
url = "https://edm.ieeesiberia.org/",

}

RIS

TY - GEN

T1 - Using Machine Learning Methods to Search for EEG and Genetic Markers of Depressive Disorder

AU - Zorina, Kseniya

AU - Kriveckiy, Andrey

AU - Klemeshova, Darya

AU - Bocharov, Andrey

AU - Karmanov, Vitaliy

N1 - Conference code: 26

PY - 2025/8/8

Y1 - 2025/8/8

N2 - Depression is one of the most common mental disorders. Therefore, the development of new methods for early diagnosis of depression is a highly relevant task. It is well known that depression has both a genetic predisposition and greatly depends on the patient's life background. Therefore, the analysis of only genetic markers of depression is usually unsuccessful, because it does not take into account the physiological state of a person at the time of examination. The aim of our study was to develop an algorithm for the joint analysis of a collection of genetic and neurophysiological data collected from healthy people and patients with depression to identify genetic markers and neurophysiological correlates of pathology. As EEG indicators, we considered the amplitudes of evoked potentials under the conditions of performing tasks in the stop-signal paradigm. We applied machine learning algorithms that allow us to identify single nucleotide polymorphisms associated with the risk of depression.

AB - Depression is one of the most common mental disorders. Therefore, the development of new methods for early diagnosis of depression is a highly relevant task. It is well known that depression has both a genetic predisposition and greatly depends on the patient's life background. Therefore, the analysis of only genetic markers of depression is usually unsuccessful, because it does not take into account the physiological state of a person at the time of examination. The aim of our study was to develop an algorithm for the joint analysis of a collection of genetic and neurophysiological data collected from healthy people and patients with depression to identify genetic markers and neurophysiological correlates of pathology. As EEG indicators, we considered the amplitudes of evoked potentials under the conditions of performing tasks in the stop-signal paradigm. We applied machine learning algorithms that allow us to identify single nucleotide polymorphisms associated with the risk of depression.

KW - EEG

KW - analysis of variance (ANOVA)

KW - depressive disorder

KW - event-related potentials (ERPs)

KW - genetic markers

KW - machine learning

KW - singlenucleotide polymorphisms (SNPs)

KW - stopsignal paradigm (SSP)

UR - https://www.scopus.com/pages/publications/105014194893

UR - https://www.mendeley.com/catalogue/8ad6c28d-0cad-3333-a69b-b4fd11d9b171/

U2 - 10.1109/EDM65517.2025.11096763

DO - 10.1109/EDM65517.2025.11096763

M3 - Conference contribution

SN - 9781665477376

T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

SP - 1790

EP - 1793

BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

PB - IEEE Computer Society

T2 - 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)

Y2 - 27 June 2025 through 1 July 2025

ER -

ID: 68949560