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Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode. / Kandaurov, I. V.; Kurkuchekov, V. V.; Trunev, Yu A.

в: Journal of Physics: Conference Series, Том 830, № 1, 012032, 04.05.2017.

Результаты исследований: Научные публикации в периодических изданияхстатья по материалам конференцииРецензирование

Harvard

Kandaurov, IV, Kurkuchekov, VV & Trunev, YA 2017, 'Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode', Journal of Physics: Conference Series, Том. 830, № 1, 012032. https://doi.org/10.1088/1742-6596/830/1/012032

APA

Kandaurov, I. V., Kurkuchekov, V. V., & Trunev, Y. A. (2017). Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode. Journal of Physics: Conference Series, 830(1), [012032]. https://doi.org/10.1088/1742-6596/830/1/012032

Vancouver

Kandaurov IV, Kurkuchekov VV, Trunev YA. Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode. Journal of Physics: Conference Series. 2017 май 4;830(1):012032. doi: 10.1088/1742-6596/830/1/012032

Author

Kandaurov, I. V. ; Kurkuchekov, V. V. ; Trunev, Yu A. / Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode. в: Journal of Physics: Conference Series. 2017 ; Том 830, № 1.

BibTeX

@article{6e6111f070a84de981b92c495950b2ad,
title = "Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode",
abstract = "The use of plasma emission cathode in the conjunction with a multiple apertured electron optical system (EOS) is promising for the multi-MW class electron beams of a large cross-sectional area. In a multi-aperture source, the beam parameters could be raised simply due to increase of the number of apertures (i.e. an effective emission area), if a uniformity of the electron emission over a large-area plasma cathode is ensured. In the presented paper, the cross-sectional distribution of the emission current density was investigated using the X-ray diagnostic technique for two versions of the diode-type EOS, with electrodes performed as flat molybdenum {"}grids{"}. The first one had 241 apertures arranged hexagonally inside a circle with a diameter of 8.3 cm and the second had 499 apertures within a circle of 11.8cm diameter. The emission plasma is produced using a single arc-discharge plasma generator placed on the axis at 20 cm from the EOS. It was demonstrated that multi-aperture systems with a single on-axis plasma generator can be effectively employed to obtain large-area beams, even in the presence of the guiding magnetic field. All apertures are emitting in the 499-apertured EOS. The beam current density is quite uniform up to the radius 2.5cm and gradually decreases to the periphery.",
author = "Kandaurov, {I. V.} and Kurkuchekov, {V. V.} and Trunev, {Yu A.}",
year = "2017",
month = may,
day = "4",
doi = "10.1088/1742-6596/830/1/012032",
language = "English",
volume = "830",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",

}

RIS

TY - JOUR

T1 - Study of electron beam uniformity in large-area multi-aperture diode with arc plasma cathode

AU - Kandaurov, I. V.

AU - Kurkuchekov, V. V.

AU - Trunev, Yu A.

PY - 2017/5/4

Y1 - 2017/5/4

N2 - The use of plasma emission cathode in the conjunction with a multiple apertured electron optical system (EOS) is promising for the multi-MW class electron beams of a large cross-sectional area. In a multi-aperture source, the beam parameters could be raised simply due to increase of the number of apertures (i.e. an effective emission area), if a uniformity of the electron emission over a large-area plasma cathode is ensured. In the presented paper, the cross-sectional distribution of the emission current density was investigated using the X-ray diagnostic technique for two versions of the diode-type EOS, with electrodes performed as flat molybdenum "grids". The first one had 241 apertures arranged hexagonally inside a circle with a diameter of 8.3 cm and the second had 499 apertures within a circle of 11.8cm diameter. The emission plasma is produced using a single arc-discharge plasma generator placed on the axis at 20 cm from the EOS. It was demonstrated that multi-aperture systems with a single on-axis plasma generator can be effectively employed to obtain large-area beams, even in the presence of the guiding magnetic field. All apertures are emitting in the 499-apertured EOS. The beam current density is quite uniform up to the radius 2.5cm and gradually decreases to the periphery.

AB - The use of plasma emission cathode in the conjunction with a multiple apertured electron optical system (EOS) is promising for the multi-MW class electron beams of a large cross-sectional area. In a multi-aperture source, the beam parameters could be raised simply due to increase of the number of apertures (i.e. an effective emission area), if a uniformity of the electron emission over a large-area plasma cathode is ensured. In the presented paper, the cross-sectional distribution of the emission current density was investigated using the X-ray diagnostic technique for two versions of the diode-type EOS, with electrodes performed as flat molybdenum "grids". The first one had 241 apertures arranged hexagonally inside a circle with a diameter of 8.3 cm and the second had 499 apertures within a circle of 11.8cm diameter. The emission plasma is produced using a single arc-discharge plasma generator placed on the axis at 20 cm from the EOS. It was demonstrated that multi-aperture systems with a single on-axis plasma generator can be effectively employed to obtain large-area beams, even in the presence of the guiding magnetic field. All apertures are emitting in the 499-apertured EOS. The beam current density is quite uniform up to the radius 2.5cm and gradually decreases to the periphery.

UR - http://www.scopus.com/inward/record.url?scp=85020045891&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/830/1/012032

DO - 10.1088/1742-6596/830/1/012032

M3 - Conference article

AN - SCOPUS:85020045891

VL - 830

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012032

ER -

ID: 10187489