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Stochastic simulation of exciton transport in semiconductor heterostructures. / Sabelfeld, Karl; Aksyuk, Ivan.

в: Russian Journal of Numerical Analysis and Mathematical Modelling, Том 39, № 3, 01.06.2024, стр. 143-156.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

Harvard

Sabelfeld, K & Aksyuk, I 2024, 'Stochastic simulation of exciton transport in semiconductor heterostructures', Russian Journal of Numerical Analysis and Mathematical Modelling, Том. 39, № 3, стр. 143-156. https://doi.org/10.1515/rnam-2024-0014

APA

Sabelfeld, K., & Aksyuk, I. (2024). Stochastic simulation of exciton transport in semiconductor heterostructures. Russian Journal of Numerical Analysis and Mathematical Modelling, 39(3), 143-156. https://doi.org/10.1515/rnam-2024-0014

Vancouver

Sabelfeld K, Aksyuk I. Stochastic simulation of exciton transport in semiconductor heterostructures. Russian Journal of Numerical Analysis and Mathematical Modelling. 2024 июнь 1;39(3):143-156. doi: 10.1515/rnam-2024-0014

Author

Sabelfeld, Karl ; Aksyuk, Ivan. / Stochastic simulation of exciton transport in semiconductor heterostructures. в: Russian Journal of Numerical Analysis and Mathematical Modelling. 2024 ; Том 39, № 3. стр. 143-156.

BibTeX

@article{451000364c4042e4ad53dd7edc67ce21,
title = "Stochastic simulation of exciton transport in semiconductor heterostructures",
abstract = "Stochastic simulation algorithm for solving exciton transport in a 3D layered semiconductor heterostructure is developed. The problem is governed by a transient drift-diffusion-recombination equation with Dirichlet and Neumann mixed boundary conditions. The semiconductor is represented as an infinite multilayer of finite thickness along the transverse coordinate z. The multilayer is composed by a set of sublayers of different materials so that the excitons have different diffusion and recombination coefficients in each layer. Continuity of solutions and fluxes at the plane interfaces between layers are imposed. The stochastic simulation algorithm solves the transport problem by tracking exciton trajectories in accordance with the probability distributions represented through the Green function of the problem in each sublayer. The method is meshless, the excitons jump only over the plane boundaries of the layers. This explains the high efficiency of the method. Simulation results for transport problems with different mixed boundary conditions are presented.",
keywords = "Semiconductor heterostructures, distribution of exit positions, exciton fluxes, first passage time, random walks and random jumps",
author = "Karl Sabelfeld and Ivan Aksyuk",
note = "The research was performed within the framework of the state assignment of ICMMG SB RAS FWNM- 2022-0002.",
year = "2024",
month = jun,
day = "1",
doi = "10.1515/rnam-2024-0014",
language = "English",
volume = "39",
pages = "143--156",
journal = "Russian Journal of Numerical Analysis and Mathematical Modelling",
issn = "0927-6467",
publisher = "Walter de Gruyter GmbH",
number = "3",

}

RIS

TY - JOUR

T1 - Stochastic simulation of exciton transport in semiconductor heterostructures

AU - Sabelfeld, Karl

AU - Aksyuk, Ivan

N1 - The research was performed within the framework of the state assignment of ICMMG SB RAS FWNM- 2022-0002.

PY - 2024/6/1

Y1 - 2024/6/1

N2 - Stochastic simulation algorithm for solving exciton transport in a 3D layered semiconductor heterostructure is developed. The problem is governed by a transient drift-diffusion-recombination equation with Dirichlet and Neumann mixed boundary conditions. The semiconductor is represented as an infinite multilayer of finite thickness along the transverse coordinate z. The multilayer is composed by a set of sublayers of different materials so that the excitons have different diffusion and recombination coefficients in each layer. Continuity of solutions and fluxes at the plane interfaces between layers are imposed. The stochastic simulation algorithm solves the transport problem by tracking exciton trajectories in accordance with the probability distributions represented through the Green function of the problem in each sublayer. The method is meshless, the excitons jump only over the plane boundaries of the layers. This explains the high efficiency of the method. Simulation results for transport problems with different mixed boundary conditions are presented.

AB - Stochastic simulation algorithm for solving exciton transport in a 3D layered semiconductor heterostructure is developed. The problem is governed by a transient drift-diffusion-recombination equation with Dirichlet and Neumann mixed boundary conditions. The semiconductor is represented as an infinite multilayer of finite thickness along the transverse coordinate z. The multilayer is composed by a set of sublayers of different materials so that the excitons have different diffusion and recombination coefficients in each layer. Continuity of solutions and fluxes at the plane interfaces between layers are imposed. The stochastic simulation algorithm solves the transport problem by tracking exciton trajectories in accordance with the probability distributions represented through the Green function of the problem in each sublayer. The method is meshless, the excitons jump only over the plane boundaries of the layers. This explains the high efficiency of the method. Simulation results for transport problems with different mixed boundary conditions are presented.

KW - Semiconductor heterostructures

KW - distribution of exit positions

KW - exciton fluxes

KW - first passage time

KW - random walks and random jumps

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85195610785&origin=inward&txGid=1d060d573ef64ea69bc008fb8e793f03

UR - https://www.mendeley.com/catalogue/8c9bad92-7867-3507-9842-8f02140ab79d/

U2 - 10.1515/rnam-2024-0014

DO - 10.1515/rnam-2024-0014

M3 - Article

VL - 39

SP - 143

EP - 156

JO - Russian Journal of Numerical Analysis and Mathematical Modelling

JF - Russian Journal of Numerical Analysis and Mathematical Modelling

SN - 0927-6467

IS - 3

ER -

ID: 61116547