Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Semiconductor photocatalysts and mechanisms of carbon dioxide reduction and nitrogen fixation under UV and visible light. / Kozlova, Ekaterina A.; Lyulyukin, Mikhail N.; Kozlov, Denis V. и др.
в: Russian Chemical Reviews, Том 90, № 12, 12.2021, стр. 1520-1543.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Semiconductor photocatalysts and mechanisms of carbon dioxide reduction and nitrogen fixation under UV and visible light
AU - Kozlova, Ekaterina A.
AU - Lyulyukin, Mikhail N.
AU - Kozlov, Denis V.
AU - Parmon, Valentin N.
N1 - Publisher Copyright: © 2021 Uspekhi Khimii, ZIOC RAS, Russian Academy of Sciences and IOP Publishing Limited.
PY - 2021/12
Y1 - 2021/12
N2 - The review summarizes the current knowledge about heterogeneous semiconductor photocatalysts that are active towards photocatalytic reduction of carbon dioxide and molecular nitrogen under visible and near-UV light. The main classes of these photocatalysts and characteristic features of their application in the target processes are considered. Primary attention is given to photocatalysts based on titanium dioxide, which have high activity and stability in the carbon dioxide reduction. For the first time, the photofixation of nitrogen under irradiation in the presence of various semiconductor materials is considered in detail. The bibliography includes 264 references.
AB - The review summarizes the current knowledge about heterogeneous semiconductor photocatalysts that are active towards photocatalytic reduction of carbon dioxide and molecular nitrogen under visible and near-UV light. The main classes of these photocatalysts and characteristic features of their application in the target processes are considered. Primary attention is given to photocatalysts based on titanium dioxide, which have high activity and stability in the carbon dioxide reduction. For the first time, the photofixation of nitrogen under irradiation in the presence of various semiconductor materials is considered in detail. The bibliography includes 264 references.
UR - http://www.scopus.com/inward/record.url?scp=85123551827&partnerID=8YFLogxK
UR - https://www.mendeley.com/catalogue/8b906008-fb41-3b3a-98ad-2230d3647251/
U2 - 10.1070/RCR5004
DO - 10.1070/RCR5004
M3 - Article
AN - SCOPUS:85123551827
VL - 90
SP - 1520
EP - 1543
JO - Russian Chemical Reviews
JF - Russian Chemical Reviews
SN - 0036-021X
IS - 12
ER -
ID: 35385095