Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
Prediction of Anxiety Levels Based on Spatial-Frequency Patterns of EEG Activity During Perception of Another Person's Face. / Lozhnikov, Victor.
International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2025. стр. 1850-1853 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
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TY - GEN
T1 - Prediction of Anxiety Levels Based on Spatial-Frequency Patterns of EEG Activity During Perception of Another Person's Face
AU - Lozhnikov, Victor
N1 - Conference code: 26
PY - 2025/8/8
Y1 - 2025/8/8
N2 - This study proposes a method for predicting anxiety levels by analyzing the spatial-frequency characteristics of electroencephalogram (EEG) data. The experiment investigated spectral power density (PSD) shifts triggered by exposure to unfamiliar facial stimuli versus a neutral baseline (blank screen), with data collected from 61 healthy Russian and Chinese students. To mitigate electrode configuration dependencies, electroencephalogram data were normalized via interpolation onto a uniform grid. A regression model (Ridge, α=0.012) revealed a relationship between spatial-frequency patterns and State-Trait Anxiety Inventory (STAI) scores (MAE = 0.16, R2 = 0.3). Features associated with the beta frequency range (17-32 Hz) in the parietal and right temporal regions contributed most significantly to anxiety prediction. Although the model's statistical reliability is insufficient to draw definitive conclusions about anxiety levels, it identifies electroencephalogram biomarkers (beta-band oscillations) and cortical regions linked to heightened anxiety. These findings offer insights into neurophysiological mechanisms underlying anxiety and potential pathways for anxiolytic interventions.
AB - This study proposes a method for predicting anxiety levels by analyzing the spatial-frequency characteristics of electroencephalogram (EEG) data. The experiment investigated spectral power density (PSD) shifts triggered by exposure to unfamiliar facial stimuli versus a neutral baseline (blank screen), with data collected from 61 healthy Russian and Chinese students. To mitigate electrode configuration dependencies, electroencephalogram data were normalized via interpolation onto a uniform grid. A regression model (Ridge, α=0.012) revealed a relationship between spatial-frequency patterns and State-Trait Anxiety Inventory (STAI) scores (MAE = 0.16, R2 = 0.3). Features associated with the beta frequency range (17-32 Hz) in the parietal and right temporal regions contributed most significantly to anxiety prediction. Although the model's statistical reliability is insufficient to draw definitive conclusions about anxiety levels, it identifies electroencephalogram biomarkers (beta-band oscillations) and cortical regions linked to heightened anxiety. These findings offer insights into neurophysiological mechanisms underlying anxiety and potential pathways for anxiolytic interventions.
KW - anxiety disorder
KW - eeg
KW - eeg signal processing
KW - machine learning
KW - regression
KW - spectral analysis
UR - https://www.scopus.com/pages/publications/105014203073
UR - https://www.mendeley.com/catalogue/78c8584d-9842-3277-b2c7-49afa13586c7/
U2 - 10.1109/EDM65517.2025.11096655
DO - 10.1109/EDM65517.2025.11096655
M3 - Conference contribution
SN - 9781665477376
T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
SP - 1850
EP - 1853
BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
PB - IEEE Computer Society
T2 - 2025 IEEE 26th International Conference of Young Professionals in Electron Devices and Materials (EDM)
Y2 - 27 June 2025 through 1 July 2025
ER -
ID: 68937690