Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Novel single-source precursors for SiB:XCyNz film deposition. / Merenkov, Ivan S.; Gostevskii, Boris A.; Krasnov, Pavel O. и др.
в: New Journal of Chemistry, Том 41, № 20, 2017, стр. 11926-11933.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Novel single-source precursors for SiB:XCyNz film deposition
AU - Merenkov, Ivan S.
AU - Gostevskii, Boris A.
AU - Krasnov, Pavel O.
AU - Basova, Tamara V.
AU - Zhukov, Yuri M.
AU - Kasatkin, Igor A.
AU - Sysoev, Sergey V.
AU - Kosyakov, Victor I.
AU - Khomyakov, Maksim N.
AU - Kosinova, Marina L.
PY - 2017
Y1 - 2017
N2 - Novel CVD precursors for SiBxCyNz film deposition such as HCCB[N(SiMe3)2]2, MeB[N(SiMe3)2]2 and Me3SiCCB[N(SiMe3)2]2 were synthesized. The structure and composition of the compounds were investigated with NMR, FTIR, Raman spectroscopies and CHN-analysis. Comparison of theoretical and experimental FTIR and Raman data was performed. Thermogravimetric analysis and the static tensimetry method with a glass membrane null manometer demonstrated that Me3SiCCB[N(SiMe3)2]2 is the most suitable CVD precursor. The formation of SiBxCyNz films was predicted using thermodynamic modelling at a temperature below 1600 K in the total pressure range of 0.27-1333 Pa. The films of chemical composition Si23.7B8.3C51.4N9.6O7 were deposited by low-pressure chemical vapour deposition (LPCVD) and their morphology and mechanical properties were investigated. The amorphous SiBxCyNz films with a smooth surface exhibited hardness, Young's modulus and elastic recovery equal to 17.5 ± 0.9 GPa, 176 ± 11 GPa and 61 ± 2%, respectively.
AB - Novel CVD precursors for SiBxCyNz film deposition such as HCCB[N(SiMe3)2]2, MeB[N(SiMe3)2]2 and Me3SiCCB[N(SiMe3)2]2 were synthesized. The structure and composition of the compounds were investigated with NMR, FTIR, Raman spectroscopies and CHN-analysis. Comparison of theoretical and experimental FTIR and Raman data was performed. Thermogravimetric analysis and the static tensimetry method with a glass membrane null manometer demonstrated that Me3SiCCB[N(SiMe3)2]2 is the most suitable CVD precursor. The formation of SiBxCyNz films was predicted using thermodynamic modelling at a temperature below 1600 K in the total pressure range of 0.27-1333 Pa. The films of chemical composition Si23.7B8.3C51.4N9.6O7 were deposited by low-pressure chemical vapour deposition (LPCVD) and their morphology and mechanical properties were investigated. The amorphous SiBxCyNz films with a smooth surface exhibited hardness, Young's modulus and elastic recovery equal to 17.5 ± 0.9 GPa, 176 ± 11 GPa and 61 ± 2%, respectively.
KW - C-N FILMS
KW - GAUSSIAN-BASIS SETS
KW - RAMAN-SPECTRA
KW - ATOMS LI
KW - APPROXIMATION
KW - ENERGY
UR - http://www.scopus.com/inward/record.url?scp=85031044208&partnerID=8YFLogxK
U2 - 10.1039/c7nj01651d
DO - 10.1039/c7nj01651d
M3 - Article
AN - SCOPUS:85031044208
VL - 41
SP - 11926
EP - 11933
JO - New Journal of Chemistry
JF - New Journal of Chemistry
SN - 1144-0546
IS - 20
ER -
ID: 25438249