Standard

Mixed feed and its ingredients electron beam decontamination. / Bezuglov, V. V.; Bryazgin, A. A.; Yu Vlasov, A. и др.

в: IOP Conference Series: Materials Science and Engineering, Том 168, № 1, 012111, 07.02.2017.

Результаты исследований: Научные публикации в периодических изданиях › статья по материалам конференции › Рецензирование

Harvard

Bezuglov, VV, Bryazgin, AA, Yu Vlasov, A, Voronin, LA, Ites, YV, Korobeynikov, MV, Leonov, SV, Leonova, MA, Tkachenko, VO, Shtarklev, EA & Yuskov, YG 2017, 'Mixed feed and its ingredients electron beam decontamination', IOP Conference Series: Materials Science and Engineering, Том. 168, № 1, 012111. https://doi.org/10.1088/1757-899X/168/1/012111

APA

Bezuglov, V. V., Bryazgin, A. A., Yu Vlasov, A., Voronin, L. A., Ites, Y. V., Korobeynikov, M. V., Leonov, S. V., Leonova, M. A., Tkachenko, V. O., Shtarklev, E. A., & Yuskov, Y. G. (2017). Mixed feed and its ingredients electron beam decontamination. IOP Conference Series: Materials Science and Engineering, 168(1), [012111]. https://doi.org/10.1088/1757-899X/168/1/012111

Vancouver

Bezuglov VV, Bryazgin AA, Yu Vlasov A, Voronin LA, Ites YV, Korobeynikov MV и др. Mixed feed and its ingredients electron beam decontamination. IOP Conference Series: Materials Science and Engineering. 2017 февр. 7;168(1):012111. doi: 10.1088/1757-899X/168/1/012111

Author

Bezuglov, V. V. ; Bryazgin, A. A. ; Yu Vlasov, A. и др. / Mixed feed and its ingredients electron beam decontamination. в: IOP Conference Series: Materials Science and Engineering. 2017 ; Том 168, № 1.

BibTeX

@article{cab2d69b4f054d9094387e38d798f3ec,
title = "Mixed feed and its ingredients electron beam decontamination",
abstract = "Electron beam treatment is used for food processing for decades to prevent or minimize food losses and prolong storage time. This process is also named cold pasteurization. Mixed feed ingredients supplied in Russia regularly occur to be contaminated. To reduce contamination level the contaminated mixed feed ingredients samples were treated by electron beam with doses from 2 to 12 kGy. The contamination levels were decreased to the level that ensuring storage time up to 1 year.",
author = "Bezuglov, {V. V.} and Bryazgin, {A. A.} and {Yu Vlasov}, A. and Voronin, {L. A.} and Ites, {Yu V.} and Korobeynikov, {M. V.} and Leonov, {S. V.} and Leonova, {M. A.} and Tkachenko, {V. O.} and Shtarklev, {E. A.} and Yuskov, {Yu G.}",
year = "2017",
month = feb,
day = "7",
doi = "10.1088/1757-899X/168/1/012111",
language = "English",
volume = "168",
journal = "IOP Conference Series: Materials Science and Engineering",
issn = "1757-8981",
publisher = "IOP Publishing Ltd.",
number = "1",

}

RIS

TY - JOUR

T1 - Mixed feed and its ingredients electron beam decontamination

AU - Bezuglov, V. V.

AU - Bryazgin, A. A.

AU - Yu Vlasov, A.

AU - Voronin, L. A.

AU - Ites, Yu V.

AU - Korobeynikov, M. V.

AU - Leonov, S. V.

AU - Leonova, M. A.

AU - Tkachenko, V. O.

AU - Shtarklev, E. A.

AU - Yuskov, Yu G.

PY - 2017/2/7

Y1 - 2017/2/7

N2 - Electron beam treatment is used for food processing for decades to prevent or minimize food losses and prolong storage time. This process is also named cold pasteurization. Mixed feed ingredients supplied in Russia regularly occur to be contaminated. To reduce contamination level the contaminated mixed feed ingredients samples were treated by electron beam with doses from 2 to 12 kGy. The contamination levels were decreased to the level that ensuring storage time up to 1 year.

AB - Electron beam treatment is used for food processing for decades to prevent or minimize food losses and prolong storage time. This process is also named cold pasteurization. Mixed feed ingredients supplied in Russia regularly occur to be contaminated. To reduce contamination level the contaminated mixed feed ingredients samples were treated by electron beam with doses from 2 to 12 kGy. The contamination levels were decreased to the level that ensuring storage time up to 1 year.

UR - http://www.scopus.com/inward/record.url?scp=85014480690&partnerID=8YFLogxK

U2 - 10.1088/1757-899X/168/1/012111

DO - 10.1088/1757-899X/168/1/012111

M3 - Conference article

AN - SCOPUS:85014480690

VL - 168

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

SN - 1757-8981

IS - 1

M1 - 012111

ER -

ID: 10277821