Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
Measurements of the Thin Liquid Droplet thickness by the Schlieren Method. / Пещенюк, Юлия Александровна; Семенов, Андрей Александрович; Шатский, Евгений Николаевич и др.
28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC). Institute of Electrical and Electronics Engineers (IEEE), 2022.Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование
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TY - GEN
T1 - Measurements of the Thin Liquid Droplet thickness by the Schlieren Method
AU - Пещенюк, Юлия Александровна
AU - Семенов, Андрей Александрович
AU - Шатский, Евгений Николаевич
AU - Ayvazyan, Gagik Y.
AU - Гатапова, Елизавета Яковлевна
N1 - The study was supported by Russian Science Foundation (project 20-19-00722), characterization of the wetting properties of the black silicon was supported by the state contract with IT SB RAS (121031800213-0) on the KRUSS DSA-100E of large-scale research facilities “TGD complex IT SB RAS”
PY - 2022
Y1 - 2022
N2 - The dynamics of thin liquid drops evaporating from structured surfaces is of fundamental importance in the study of heat transfer from such surfaces. This work is devoted to the study of the thickness of a sessile water drop during evaporation from a solid substrate. Black silicon was used as a substrate, the average absorbance of which in the wavelength range of 300–750 nm is 94%. The change in the droplet thickness during evaporation was studied by the Schlieren method with a stepped filter. For this purpose, a method for processing the obtained schlieren images was developed and tested in MATLAB. This method makes it possible to calculate droplet profiles, their surface area and volume. Based on the data obtained, the specific mass flow rate from the liquid surface and the speed of the contact line were determined.
AB - The dynamics of thin liquid drops evaporating from structured surfaces is of fundamental importance in the study of heat transfer from such surfaces. This work is devoted to the study of the thickness of a sessile water drop during evaporation from a solid substrate. Black silicon was used as a substrate, the average absorbance of which in the wavelength range of 300–750 nm is 94%. The change in the droplet thickness during evaporation was studied by the Schlieren method with a stepped filter. For this purpose, a method for processing the obtained schlieren images was developed and tested in MATLAB. This method makes it possible to calculate droplet profiles, their surface area and volume. Based on the data obtained, the specific mass flow rate from the liquid surface and the speed of the contact line were determined.
KW - droplet
KW - evaporation
KW - profile
KW - schlieren method
UR - https://www.mendeley.com/catalogue/e2ed03b2-e85c-335e-af33-dd68c2264c12/
U2 - 10.1109/THERMINIC57263.2022.9950648
DO - 10.1109/THERMINIC57263.2022.9950648
M3 - Conference contribution
SN - 9781665492294
BT - 28th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -
ID: 55420284