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Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm. / Kostyukova, N. Yu; Boyko, A. A.; Eranov, I. D. и др.

Proceedings - International Conference Laser Optics 2020, ICLO 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9285495 (Proceedings - International Conference Laser Optics 2020, ICLO 2020).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференций › статья в сборнике материалов конференции › научная › Рецензирование

Harvard

Kostyukova, NY, Boyko, AA, Eranov, ID, Kolker, DB, Antipov, OL, Erushin, EY, Kostyukov, AI, Badikov, DV & Badikov, VV 2020, Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm. в Proceedings - International Conference Laser Optics 2020, ICLO 2020., 9285495, Proceedings - International Conference Laser Optics 2020, ICLO 2020, Institute of Electrical and Electronics Engineers Inc., 2020 International Conference Laser Optics, ICLO 2020, St. Petersburg, Российская Федерация, 02.11.2020. https://doi.org/10.1109/ICLO48556.2020.9285495

APA

Kostyukova, N. Y., Boyko, A. A., Eranov, I. D., Kolker, D. B., Antipov, O. L., Erushin, E. Y., Kostyukov, A. I., Badikov, D. V., & Badikov, V. V. (2020). Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm. в Proceedings - International Conference Laser Optics 2020, ICLO 2020 [9285495] (Proceedings - International Conference Laser Optics 2020, ICLO 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICLO48556.2020.9285495

Vancouver

Kostyukova NY, Boyko AA, Eranov ID, Kolker DB, Antipov OL, Erushin EY и др. Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm. в Proceedings - International Conference Laser Optics 2020, ICLO 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9285495. (Proceedings - International Conference Laser Optics 2020, ICLO 2020). doi: 10.1109/ICLO48556.2020.9285495

Author

Kostyukova, N. Yu ; Boyko, A. A. ; Eranov, I. D. и др. / Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm. Proceedings - International Conference Laser Optics 2020, ICLO 2020. Institute of Electrical and Electronics Engineers Inc., 2020. (Proceedings - International Conference Laser Optics 2020, ICLO 2020).

BibTeX

@inproceedings{552b875f1fa147f0a6c779b63dd1a40f,
title = "Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm",
abstract = "This paper is devoted to a determination of the 0% probability laser-induced damage threshold of the BaGa4Se7 and BaGa2GeSe6 nonlinear elements by the R-on-1 procedure. A Ho:YAG laser radiation at 2091 nm with pulse duration 13-17 ns and varied pulse repetition rate, 2 kHz, 5 kHz and 10 kHz, was used for testing.",
keywords = "barium chalcogenides, laser-induced damage threshold (LIDT)",
author = "Kostyukova, {N. Yu} and Boyko, {A. A.} and Eranov, {I. D.} and Kolker, {D. B.} and Antipov, {O. L.} and Erushin, {E. Yu} and Kostyukov, {A. I.} and Badikov, {D. V.} and Badikov, {V. V.}",
note = "Funding Information: ACKNOWLEDGMENT The reported study was funded by RFBR according to the research project № 18-32-00105 (investigation of LIDT experiments), Ministry of Education and Science of the Russian Federation, project № 0035-2019-0012 (optimization of Ho:YAG laser set-up for LIDT test) and Federal Program № FSUS 2020-0036 (microscopy of damaged plates). Publisher Copyright: {\textcopyright} 2020 IEEE. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.; 2020 International Conference Laser Optics, ICLO 2020 ; Conference date: 02-11-2020 Through 06-11-2020",
year = "2020",
month = nov,
day = "2",
doi = "10.1109/ICLO48556.2020.9285495",
language = "English",
isbn = "9781728152332",
series = "Proceedings - International Conference Laser Optics 2020, ICLO 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - International Conference Laser Optics 2020, ICLO 2020",
address = "United States",

}

RIS

TY - GEN

T1 - Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm

AU - Kostyukova, N. Yu

AU - Boyko, A. A.

AU - Eranov, I. D.

AU - Kolker, D. B.

AU - Antipov, O. L.

AU - Erushin, E. Yu

AU - Kostyukov, A. I.

AU - Badikov, D. V.

AU - Badikov, V. V.

N1 - Funding Information: ACKNOWLEDGMENT The reported study was funded by RFBR according to the research project № 18-32-00105 (investigation of LIDT experiments), Ministry of Education and Science of the Russian Federation, project № 0035-2019-0012 (optimization of Ho:YAG laser set-up for LIDT test) and Federal Program № FSUS 2020-0036 (microscopy of damaged plates). Publisher Copyright: © 2020 IEEE. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.

PY - 2020/11/2

Y1 - 2020/11/2

N2 - This paper is devoted to a determination of the 0% probability laser-induced damage threshold of the BaGa4Se7 and BaGa2GeSe6 nonlinear elements by the R-on-1 procedure. A Ho:YAG laser radiation at 2091 nm with pulse duration 13-17 ns and varied pulse repetition rate, 2 kHz, 5 kHz and 10 kHz, was used for testing.

AB - This paper is devoted to a determination of the 0% probability laser-induced damage threshold of the BaGa4Se7 and BaGa2GeSe6 nonlinear elements by the R-on-1 procedure. A Ho:YAG laser radiation at 2091 nm with pulse duration 13-17 ns and varied pulse repetition rate, 2 kHz, 5 kHz and 10 kHz, was used for testing.

KW - barium chalcogenides

KW - laser-induced damage threshold (LIDT)

UR - http://www.scopus.com/inward/record.url?scp=85099350524&partnerID=8YFLogxK

UR - https://www.mendeley.com/catalogue/79fb0f1f-af07-33ca-9239-e71a5d83e338/

U2 - 10.1109/ICLO48556.2020.9285495

DO - 10.1109/ICLO48556.2020.9285495

M3 - Conference contribution

AN - SCOPUS:85099350524

SN - 9781728152332

T3 - Proceedings - International Conference Laser Optics 2020, ICLO 2020

BT - Proceedings - International Conference Laser Optics 2020, ICLO 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 International Conference Laser Optics, ICLO 2020

Y2 - 2 November 2020 through 6 November 2020

ER -

ID: 27485713