Standard

iOk Platform for Automated Object Detection and Analysis in Microscopy Images. / Kudinov, Vitalii Yu.; Matveev, Andrey V.; Nartova, Anna V. и др.

Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), 2023. стр. 1420-1423.

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаяРецензирование

Harvard

Kudinov, VY, Matveev, AV, Nartova, AV, Sankova, NN, Belotserkovskii, VA & Okunev, AG 2023, iOk Platform for Automated Object Detection and Analysis in Microscopy Images. в Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), стр. 1420-1423, 16th IEEE International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, Новосибирск, Российская Федерация, 10.11.2023. https://doi.org/10.1109/apeie59731.2023.10347794

APA

Kudinov, V. Y., Matveev, A. V., Nartova, A. V., Sankova, N. N., Belotserkovskii, V. A., & Okunev, A. G. (2023). iOk Platform for Automated Object Detection and Analysis in Microscopy Images. в Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023 (стр. 1420-1423). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/apeie59731.2023.10347794

Vancouver

Kudinov VY, Matveev AV, Nartova AV, Sankova NN, Belotserkovskii VA, Okunev AG. iOk Platform for Automated Object Detection and Analysis in Microscopy Images. в Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE). 2023. стр. 1420-1423 doi: 10.1109/apeie59731.2023.10347794

Author

Kudinov, Vitalii Yu. ; Matveev, Andrey V. ; Nartova, Anna V. и др. / iOk Platform for Automated Object Detection and Analysis in Microscopy Images. Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023. Institute of Electrical and Electronics Engineers (IEEE), 2023. стр. 1420-1423

BibTeX

@inproceedings{14e10a6d8d504e57b92bfb6462d88044,
title = "iOk Platform for Automated Object Detection and Analysis in Microscopy Images",
abstract = "Counting, measuring, and identifying particles is a crucial aspect of various research endeavors. Typically, images containing particles are manually processed using a software ruler. Automated processing techniques, which rely on conventional image processing methods such as edge detection and segmentation, are not universally applicable and require setting several parameters through trial and error. Additionally, these techniques can only be utilized on high-quality images. Also, the ambiguity of the data set can greatly affect the quality of object identification. The report presents the iOk platform (iok.nsu.ru), which uses artificial intelligence through the ParticlesNN web service and Telegram bots DLgram and No Code ML as well as other means of detecting objects on an image. The platform provides automatic search and analysis of objects in images without pre-processing, regardless of the type and quality of the image. At the output, you can obtain information about object recognition, its area and size, as well as its position in the image. The neural network can be trained on user images, no programming skills are required.",
author = "Kudinov, {Vitalii Yu.} and Matveev, {Andrey V.} and Nartova, {Anna V.} and Sankova, {Natalya N.} and Belotserkovskii, {Valerii A.} and Okunev, {Aleksey G.}",
note = "The work was supported by the Russian Science Foundation (project no. 22-23-00951, https://rscf.ru/project/22-23-00951/).; 16th IEEE International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023 ; Conference date: 10-11-2023 Through 12-11-2023",
year = "2023",
doi = "10.1109/apeie59731.2023.10347794",
language = "English",
isbn = "9798350330885",
pages = "1420--1423",
booktitle = "Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023",
publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

}

RIS

TY - GEN

T1 - iOk Platform for Automated Object Detection and Analysis in Microscopy Images

AU - Kudinov, Vitalii Yu.

AU - Matveev, Andrey V.

AU - Nartova, Anna V.

AU - Sankova, Natalya N.

AU - Belotserkovskii, Valerii A.

AU - Okunev, Aleksey G.

N1 - Conference code: 16

PY - 2023

Y1 - 2023

N2 - Counting, measuring, and identifying particles is a crucial aspect of various research endeavors. Typically, images containing particles are manually processed using a software ruler. Automated processing techniques, which rely on conventional image processing methods such as edge detection and segmentation, are not universally applicable and require setting several parameters through trial and error. Additionally, these techniques can only be utilized on high-quality images. Also, the ambiguity of the data set can greatly affect the quality of object identification. The report presents the iOk platform (iok.nsu.ru), which uses artificial intelligence through the ParticlesNN web service and Telegram bots DLgram and No Code ML as well as other means of detecting objects on an image. The platform provides automatic search and analysis of objects in images without pre-processing, regardless of the type and quality of the image. At the output, you can obtain information about object recognition, its area and size, as well as its position in the image. The neural network can be trained on user images, no programming skills are required.

AB - Counting, measuring, and identifying particles is a crucial aspect of various research endeavors. Typically, images containing particles are manually processed using a software ruler. Automated processing techniques, which rely on conventional image processing methods such as edge detection and segmentation, are not universally applicable and require setting several parameters through trial and error. Additionally, these techniques can only be utilized on high-quality images. Also, the ambiguity of the data set can greatly affect the quality of object identification. The report presents the iOk platform (iok.nsu.ru), which uses artificial intelligence through the ParticlesNN web service and Telegram bots DLgram and No Code ML as well as other means of detecting objects on an image. The platform provides automatic search and analysis of objects in images without pre-processing, regardless of the type and quality of the image. At the output, you can obtain information about object recognition, its area and size, as well as its position in the image. The neural network can be trained on user images, no programming skills are required.

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85182274888&origin=inward&txGid=b1410bafffdfddc5e1e28afed299f280

UR - https://www.mendeley.com/catalogue/23bb72fe-a03a-3a98-a2a8-031ef8e7bf08/

U2 - 10.1109/apeie59731.2023.10347794

DO - 10.1109/apeie59731.2023.10347794

M3 - Conference contribution

SN - 9798350330885

SP - 1420

EP - 1423

BT - Proceedings of the 2023 IEEE 16th International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering, APEIE 2023

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - 16th IEEE International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering

Y2 - 10 November 2023 through 12 November 2023

ER -

ID: 59613744