Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Implementation of high-pass subterahertz filters using high-aspect-ratio polimeric structures. / Kuznetsov, Sergei A.; Gentselev, A. N.; Baev, S. G.
в: Optoelectronics, Instrumentation and Data Processing, Том 53, № 1, 01.01.2017, стр. 88-95.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Implementation of high-pass subterahertz filters using high-aspect-ratio polimeric structures
AU - Kuznetsov, Sergei A.
AU - Gentselev, A. N.
AU - Baev, S. G.
PY - 2017/1/1
Y1 - 2017/1/1
N2 - This paper describes a technological approach to the implementation of quasioptical high-pass subterahertz filters with the use of high-aspect pseudometallic structures. The approach is based on micropatterning a solid polymer layer of polymethylmethacrylate by means of synchrotron X-ray lithography with subsequent metallization of the entire surface of the structure. A fabricated specimen and operational characteristics for the filter with a cutoff frequency of 0.275 THz, which has the thickness of 1 mm and is formed by hexagon-shaped through-holes arranged on a triangular lattice with 70-μm wide crosspieces, are demonstrated.
AB - This paper describes a technological approach to the implementation of quasioptical high-pass subterahertz filters with the use of high-aspect pseudometallic structures. The approach is based on micropatterning a solid polymer layer of polymethylmethacrylate by means of synchrotron X-ray lithography with subsequent metallization of the entire surface of the structure. A fabricated specimen and operational characteristics for the filter with a cutoff frequency of 0.275 THz, which has the thickness of 1 mm and is formed by hexagon-shaped through-holes arranged on a triangular lattice with 70-μm wide crosspieces, are demonstrated.
KW - high-aspect-ratio microstructures
KW - high-pass filters
KW - X-ray lithography
KW - WAVES
KW - SPECTROSCOPY
KW - GENERATION
KW - RADIATION
UR - http://www.scopus.com/inward/record.url?scp=85018529578&partnerID=8YFLogxK
U2 - 10.3103/S8756699017010137
DO - 10.3103/S8756699017010137
M3 - Article
AN - SCOPUS:85018529578
VL - 53
SP - 88
EP - 95
JO - Optoelectronics, Instrumentation and Data Processing
JF - Optoelectronics, Instrumentation and Data Processing
SN - 8756-6990
IS - 1
ER -
ID: 8679208