TY - JOUR

T1 - First Experimental Demonstration of the Wide-Field Amplitude Surface Plasmon Resonance Microscopy in the Terahertz Range

AU - Gerasimov, Vasiliy Valerievich

AU - Kameshkov, Oleg Eduardovich

AU - Nikitin, Alexey Konstantinovich

AU - Khasanov, Ildus Shevketovich

AU - Lemzyakov, Alexey Georgievich

AU - Antonova, Irina Veniaminovna

AU - Ivanov, Artem Ilyich

AU - Lien, Nghiem Thi Ha

AU - Nghia, Nguyen Trong

AU - Anh, Le Tu

AU - Hung, Nguyen Quoc

AU - Trang, Ta Thu

N1 - The experimental part of the work was supported by the Vietnamese Academy of Science and Technology (project QTRU01.03/20-21). The work was performed on the equipment of the shared research center SSTRC on the basis of the Novosibirsk FEL at BINP SB RAS. The formal analysis was funded by the Ministry of Science and Higher Education of the Russian Federation under State contract No. FFNS-2022-0009. Публикация для корректировки.

PY - 2023/7

Y1 - 2023/7

N2 - We have demonstrated the wide-field amplitude surface plasmon resonance (SPR) microscopy technique in the terahertz (THz) range. A Zeonex polymer prism was utilized to excite surface plasmon polaritons (SPPs) through attenuated total reflection (ATR) in an Otto configuration. Coherent quasimonochromatic radiation with a wavelength of approximately 197 μm, generated by the Novosibirsk free electron laser, was employed. Our results indicate that the SPR microscopy method is applicable for investigating the planar surfaces of semiconductors at THz frequencies, provided that the SPPs’ cutoff frequency is close to the probing radiation frequency. This condition ensures that the propagation length of the SPPs is comparable to the radiation wavelength. By varying the air gap between the prism and the surface under examination, we acquired images of a polypropylene coating 20 µm thick and a graphene coating 35 nm thick on a flat indium antimonide substrate. The boundary between the coated and uncoated regions can be precisely localized through determination of the kink in the reflection coefficient of the THz radiation beam that illuminates the boundary between the regions if the optimal conditions for the generation of the SPPs in the uncoated region are met.

AB - We have demonstrated the wide-field amplitude surface plasmon resonance (SPR) microscopy technique in the terahertz (THz) range. A Zeonex polymer prism was utilized to excite surface plasmon polaritons (SPPs) through attenuated total reflection (ATR) in an Otto configuration. Coherent quasimonochromatic radiation with a wavelength of approximately 197 μm, generated by the Novosibirsk free electron laser, was employed. Our results indicate that the SPR microscopy method is applicable for investigating the planar surfaces of semiconductors at THz frequencies, provided that the SPPs’ cutoff frequency is close to the probing radiation frequency. This condition ensures that the propagation length of the SPPs is comparable to the radiation wavelength. By varying the air gap between the prism and the surface under examination, we acquired images of a polypropylene coating 20 µm thick and a graphene coating 35 nm thick on a flat indium antimonide substrate. The boundary between the coated and uncoated regions can be precisely localized through determination of the kink in the reflection coefficient of the THz radiation beam that illuminates the boundary between the regions if the optimal conditions for the generation of the SPPs in the uncoated region are met.

KW - graphene films

KW - indium antimonide

KW - surface plasmon polaritons

KW - terahertz microscopy

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85166288303&origin=inward&txGid=d1d86c2949fe576e08b083b7379cbb7f

UR - https://www.mendeley.com/catalogue/486e40f0-d137-33b8-a2dc-0d60b7e7939e/

U2 - 10.3390/photonics10070723

DO - 10.3390/photonics10070723

M3 - Article

VL - 10

JO - Photonics

JF - Photonics

SN - 2304-6732

IS - 7

M1 - 723

ER -