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Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films. / Kukotenko, Valeria D.; Gerasimov, Vasily V.; Khasanov, Ildus Sh и др.

International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2024. стр. 1070-1073 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

Результаты исследований: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаяРецензирование

Harvard

Kukotenko, VD, Gerasimov, VV, Khasanov, IS, Lemzyakov, AG, Ivanov, AI & Antonova, IV 2024, Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films. в International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM, IEEE Computer Society, стр. 1070-1073, 25th IEEE International Conference of Young Professionals in Electron Devices and Materials, Российская Федерация, 28.06.2024. https://doi.org/10.1109/EDM61683.2024.10615076

APA

Kukotenko, V. D., Gerasimov, V. V., Khasanov, I. S., Lemzyakov, A. G., Ivanov, A. I., & Antonova, I. V. (2024). Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films. в International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM (стр. 1070-1073). (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). IEEE Computer Society. https://doi.org/10.1109/EDM61683.2024.10615076

Vancouver

Kukotenko VD, Gerasimov VV, Khasanov IS, Lemzyakov AG, Ivanov AI, Antonova IV. Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films. в International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society. 2024. стр. 1070-1073. (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM). doi: 10.1109/EDM61683.2024.10615076

Author

Kukotenko, Valeria D. ; Gerasimov, Vasily V. ; Khasanov, Ildus Sh и др. / Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films. International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. IEEE Computer Society, 2024. стр. 1070-1073 (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM).

BibTeX

@inproceedings{34ba60cb28534b6ea9e694625d640e96,
title = "Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films",
abstract = "Plasmonic components for wired and wireless (6G) communication systems, as well as sensor devices in the terahertz frequency range, are now under active development. This stimulates research on materials for integral plasmonic elements that ensure optimal characteristics of information carriers, namely surface plasmon polaritons, which have energy losses and the penetration depth of the SPP field into the air. This work presents the results of experimental studies on the penetration depth of a terahertz surface plasmon polariton field on metallic and composite graphene films. On metal, the penetration depths were found to be an order of magnitude lower than the values predicted by the Drude model for a bulk metal. The penetration depth of the surface plasmon polariton field into the dielectric depended on both the conductivity of the conducting layer and its roughness: it decreased with lower conductivity and increased roughness. Composite graphene films demonstrated high localization of the surface plasmon polariton field, which is of interest for THz sensor devices.",
keywords = "conductivity, graphene composite, metallic films, penetration depth, surface plasmon polaritons, surface roughness, terahertz range",
author = "Kukotenko, {Valeria D.} and Gerasimov, {Vasily V.} and Khasanov, {Ildus Sh} and Lemzyakov, {Alexey G.} and Ivanov, {Artem I.} and Antonova, {Irina V.}",
note = "The work was done at the shared Siberian Synchrotron and Terahertz research center on the basis of the Novosibirsk Free Electron Laser at Budker Institute of Nuclear Physics of Siberian Branch of Russian Academy of Sciences.; 25th IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2024 ; Conference date: 28-06-2024 Through 02-07-2024",
year = "2024",
doi = "10.1109/EDM61683.2024.10615076",
language = "English",
isbn = "9798350389234",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "1070--1073",
booktitle = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
address = "United States",
url = "https://edm.ieeesiberia.org/",

}

RIS

TY - GEN

T1 - Experimental Study of Terahertz Surface Wave Field on Metallic and Composite Graphene Films

AU - Kukotenko, Valeria D.

AU - Gerasimov, Vasily V.

AU - Khasanov, Ildus Sh

AU - Lemzyakov, Alexey G.

AU - Ivanov, Artem I.

AU - Antonova, Irina V.

N1 - Conference code: 25

PY - 2024

Y1 - 2024

N2 - Plasmonic components for wired and wireless (6G) communication systems, as well as sensor devices in the terahertz frequency range, are now under active development. This stimulates research on materials for integral plasmonic elements that ensure optimal characteristics of information carriers, namely surface plasmon polaritons, which have energy losses and the penetration depth of the SPP field into the air. This work presents the results of experimental studies on the penetration depth of a terahertz surface plasmon polariton field on metallic and composite graphene films. On metal, the penetration depths were found to be an order of magnitude lower than the values predicted by the Drude model for a bulk metal. The penetration depth of the surface plasmon polariton field into the dielectric depended on both the conductivity of the conducting layer and its roughness: it decreased with lower conductivity and increased roughness. Composite graphene films demonstrated high localization of the surface plasmon polariton field, which is of interest for THz sensor devices.

AB - Plasmonic components for wired and wireless (6G) communication systems, as well as sensor devices in the terahertz frequency range, are now under active development. This stimulates research on materials for integral plasmonic elements that ensure optimal characteristics of information carriers, namely surface plasmon polaritons, which have energy losses and the penetration depth of the SPP field into the air. This work presents the results of experimental studies on the penetration depth of a terahertz surface plasmon polariton field on metallic and composite graphene films. On metal, the penetration depths were found to be an order of magnitude lower than the values predicted by the Drude model for a bulk metal. The penetration depth of the surface plasmon polariton field into the dielectric depended on both the conductivity of the conducting layer and its roughness: it decreased with lower conductivity and increased roughness. Composite graphene films demonstrated high localization of the surface plasmon polariton field, which is of interest for THz sensor devices.

KW - conductivity

KW - graphene composite

KW - metallic films

KW - penetration depth

KW - surface plasmon polaritons

KW - surface roughness

KW - terahertz range

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85201933352&origin=inward&txGid=694893fa2e4fb7a8bd3beea61f430e91

UR - https://www.mendeley.com/catalogue/4914b094-d37a-3173-9302-c9abb392ef73/

U2 - 10.1109/EDM61683.2024.10615076

DO - 10.1109/EDM61683.2024.10615076

M3 - Conference contribution

SN - 9798350389234

T3 - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

SP - 1070

EP - 1073

BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM

PB - IEEE Computer Society

T2 - 25th IEEE International Conference of Young Professionals in Electron Devices and Materials

Y2 - 28 June 2024 through 2 July 2024

ER -

ID: 60549840