Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Electronic and structural peculiarities of Br2-embedded C2F : XPS and DFT study. / Cholach, Alexander; Asanov, Igor; Bryliakova, Anna и др.
в: AIP Advances, Том 8, № 8, 085319, 01.08.2018.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
}
TY - JOUR
T1 - Electronic and structural peculiarities of Br2-embedded C2F
T2 - XPS and DFT study
AU - Cholach, Alexander
AU - Asanov, Igor
AU - Bryliakova, Anna
AU - Asanova, Tatyana
AU - Pinakov, Dmitrii
AU - Okotrub, Alexander
AU - Kim, Min Gyu
N1 - Publisher Copyright: © 2018 Author(s).
PY - 2018/8/1
Y1 - 2018/8/1
N2 - The prospects of the complementary use of X-ray photoelectron spectroscopy (XPS) and density functional theory (DFT) have been demonstrated by the examples of highly oriented pyrolytic graphite, half-fluorinated graphite C2F, and half-fluorinated graphite C2F intercalated with Br C2FBr0.15. It has been shown that the photoelectron energy losses in XPS spectra conform well to valence band electron transitions resulted from the DFT calculations for relevant unit cells. This conformity justified the other results of joined XPS and DFT studies, which have revealed two arrangements of the Br2 embedded into the C2F framework. The first arrangement corresponds to separate Br pairs in which the Br state is similar to a free Br2 molecule, whereas the second one is an ultra-dense Br chain in which the Br state is between free Br2−1 and Br10 species. The specific energy losses in the XPS Br3d spectrum of C2FBr0.15 indicate a comparable content of both Br arrangements in a sample. Besides, a distinct structure in the difference F1s XPS spectrum is assigned to the expected strengthening of the C-F bond in a C2F matrix under the Br2 intercalation. The state and orientation of intercalated Br2 are juxtaposed with experimental studies by Near Edge and Extended X-ray Absorption Fine Structure spectroscopy and by Raman spectroscopy. A successful confluence of XPS and DFT can be useful in the field of material science, providing the local geometry, the state and bonding between atoms in a sample, and thereby revealing the wear performance of the material, regardless of its application.
AB - The prospects of the complementary use of X-ray photoelectron spectroscopy (XPS) and density functional theory (DFT) have been demonstrated by the examples of highly oriented pyrolytic graphite, half-fluorinated graphite C2F, and half-fluorinated graphite C2F intercalated with Br C2FBr0.15. It has been shown that the photoelectron energy losses in XPS spectra conform well to valence band electron transitions resulted from the DFT calculations for relevant unit cells. This conformity justified the other results of joined XPS and DFT studies, which have revealed two arrangements of the Br2 embedded into the C2F framework. The first arrangement corresponds to separate Br pairs in which the Br state is similar to a free Br2 molecule, whereas the second one is an ultra-dense Br chain in which the Br state is between free Br2−1 and Br10 species. The specific energy losses in the XPS Br3d spectrum of C2FBr0.15 indicate a comparable content of both Br arrangements in a sample. Besides, a distinct structure in the difference F1s XPS spectrum is assigned to the expected strengthening of the C-F bond in a C2F matrix under the Br2 intercalation. The state and orientation of intercalated Br2 are juxtaposed with experimental studies by Near Edge and Extended X-ray Absorption Fine Structure spectroscopy and by Raman spectroscopy. A successful confluence of XPS and DFT can be useful in the field of material science, providing the local geometry, the state and bonding between atoms in a sample, and thereby revealing the wear performance of the material, regardless of its application.
KW - X-RAY-ABSORPTION
KW - THERMAL-EXPANSION
KW - FINE-STRUCTURE
KW - RAMAN-SPECTRA
KW - GRAPHITE
KW - BROMINE
KW - TEMPERATURE
KW - FIBERS
KW - LAYERS
UR - http://www.scopus.com/inward/record.url?scp=85052834111&partnerID=8YFLogxK
U2 - 10.1063/1.5042289
DO - 10.1063/1.5042289
M3 - Article
AN - SCOPUS:85052834111
VL - 8
JO - AIP Advances
JF - AIP Advances
SN - 2158-3226
IS - 8
M1 - 085319
ER -
ID: 16357948