TY - JOUR

T1 - Direct analysis of high-purity cadmium by electrothermal vaporization-inductively coupled plasma optical emission spectrometry

AU - Medvedev, Nickolay S.

AU - Lundovskaya, Olga V.

AU - Saprykin, Anatoly I.

PY - 2019/3/1

Y1 - 2019/3/1

N2 - The paper presents the original technique of trace analysis of solid cadmium samples by the optical emission spectrometry with inductively coupled plasma in combination with the electrothermal vaporization (ETV-ICP-OES). The temperature program for heating ETV provides almost complete evaporation of cadmium (at 900 °C) and the subsequent vaporization of analytes when the temperature ETV rises up to 2400 °C. Separate vaporization of matrix and analytes provides reducing of spectral interferences, which ensures lower the limits of detection of the analytes (LODs). Evaluation of the analytical characteristics of the proposed technique shows that the ETV-ICP-OES allows us to reduce the detection limits of Al, Au, Be, Bi, Co, Cr, Fe, Ga, In, Mn, Ni, Re, Sn and V from 3 to 670 times compared with traditional ICP-OES analysis of 2% cadmium solutions. The accuracy of proposed technique was confirmed by analysis of cadmium samples by an independent ICP-MS technique and by addition and recovery experiment.

AB - The paper presents the original technique of trace analysis of solid cadmium samples by the optical emission spectrometry with inductively coupled plasma in combination with the electrothermal vaporization (ETV-ICP-OES). The temperature program for heating ETV provides almost complete evaporation of cadmium (at 900 °C) and the subsequent vaporization of analytes when the temperature ETV rises up to 2400 °C. Separate vaporization of matrix and analytes provides reducing of spectral interferences, which ensures lower the limits of detection of the analytes (LODs). Evaluation of the analytical characteristics of the proposed technique shows that the ETV-ICP-OES allows us to reduce the detection limits of Al, Au, Be, Bi, Co, Cr, Fe, Ga, In, Mn, Ni, Re, Sn and V from 3 to 670 times compared with traditional ICP-OES analysis of 2% cadmium solutions. The accuracy of proposed technique was confirmed by analysis of cadmium samples by an independent ICP-MS technique and by addition and recovery experiment.

KW - Direct analysis of solid samples

KW - Electrothermal vaporization

KW - High-purity cadmium

KW - Inductively coupled plasma

KW - Limits of detection

KW - Optical emission spectrometry

KW - SYSTEM

KW - TUNGSTEN-COIL

KW - GRAPHITE-FURNACE

KW - DIOXIDE

KW - DEVICE

KW - CDTE

KW - TRACE-ELEMENTS

KW - SAMPLE INTRODUCTION

KW - ETV-ICP-AES

KW - MASS SPECTROMETRY

UR - http://www.scopus.com/inward/record.url?scp=85057470586&partnerID=8YFLogxK

U2 - 10.1016/j.microc.2018.11.014

DO - 10.1016/j.microc.2018.11.014

M3 - Article

AN - SCOPUS:85057470586

VL - 145

SP - 751

EP - 755

JO - Microchemical Journal

JF - Microchemical Journal

SN - 0026-265X

ER -