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Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine. / Sukhikh, A. S.; Basova, T. V.; Gromilov, S. A.

в: Journal of Structural Chemistry, Том 57, № 3, 01.05.2016, стр. 618-621.

Результаты исследований: Научные публикации в периодических изданияхстатьяРецензирование

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Sukhikh AS, Basova TV, Gromilov SA. Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine. Journal of Structural Chemistry. 2016 май 1;57(3):618-621. doi: 10.1134/S0022476616030227

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Sukhikh, A. S. ; Basova, T. V. ; Gromilov, S. A. / Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine. в: Journal of Structural Chemistry. 2016 ; Том 57, № 3. стр. 618-621.

BibTeX

@article{2e3ad29f45a145ce8c10c220d70cb620,
title = "Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine",
abstract = "A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.",
keywords = "cobalt phthalocyanine, X-ray diffraction study of thin films",
author = "Sukhikh, {A. S.} and Basova, {T. V.} and Gromilov, {S. A.}",
year = "2016",
month = may,
day = "1",
doi = "10.1134/S0022476616030227",
language = "English",
volume = "57",
pages = "618--621",
journal = "Journal of Structural Chemistry",
issn = "0022-4766",
publisher = "Springer GmbH & Co, Auslieferungs-Gesellschaf",
number = "3",

}

RIS

TY - JOUR

T1 - Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine

AU - Sukhikh, A. S.

AU - Basova, T. V.

AU - Gromilov, S. A.

PY - 2016/5/1

Y1 - 2016/5/1

N2 - A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.

AB - A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.

KW - cobalt phthalocyanine

KW - X-ray diffraction study of thin films

UR - http://www.scopus.com/inward/record.url?scp=84978880057&partnerID=8YFLogxK

U2 - 10.1134/S0022476616030227

DO - 10.1134/S0022476616030227

M3 - Article

AN - SCOPUS:84978880057

VL - 57

SP - 618

EP - 621

JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

IS - 3

ER -

ID: 25437490