Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine. / Sukhikh, A. S.; Basova, T. V.; Gromilov, S. A.
в: Journal of Structural Chemistry, Том 57, № 3, 01.05.2016, стр. 618-621.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Development of a procedure of X-ray study of thin layers by the example of cobalt phthalocyanine
AU - Sukhikh, A. S.
AU - Basova, T. V.
AU - Gromilov, S. A.
PY - 2016/5/1
Y1 - 2016/5/1
N2 - A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.
AB - A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.
KW - cobalt phthalocyanine
KW - X-ray diffraction study of thin films
UR - http://www.scopus.com/inward/record.url?scp=84978880057&partnerID=8YFLogxK
U2 - 10.1134/S0022476616030227
DO - 10.1134/S0022476616030227
M3 - Article
AN - SCOPUS:84978880057
VL - 57
SP - 618
EP - 621
JO - Journal of Structural Chemistry
JF - Journal of Structural Chemistry
SN - 0022-4766
IS - 3
ER -
ID: 25437490