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Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy. / Dunaevskiy, M. S.; Alekseev, P. A.; Geydt, P. и др.

в: Journal of Surface Investigation, Том 13, № 1, 9, 01.01.2019, стр. 53-55.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

Harvard

Dunaevskiy, MS, Alekseev, PA, Geydt, P, Lahderanta, E, Haggren, T & Lipsanen, H 2019, 'Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy', Journal of Surface Investigation, Том. 13, № 1, 9, стр. 53-55. https://doi.org/10.1134/S1027451019010051

APA

Dunaevskiy, M. S., Alekseev, P. A., Geydt, P., Lahderanta, E., Haggren, T., & Lipsanen, H. (2019). Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy. Journal of Surface Investigation, 13(1), 53-55. [9]. https://doi.org/10.1134/S1027451019010051

Vancouver

Dunaevskiy MS, Alekseev PA, Geydt P, Lahderanta E, Haggren T, Lipsanen H. Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy. Journal of Surface Investigation. 2019 янв. 1;13(1):53-55. 9. doi: 10.1134/S1027451019010051

Author

Dunaevskiy, M. S. ; Alekseev, P. A. ; Geydt, P. и др. / Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy. в: Journal of Surface Investigation. 2019 ; Том 13, № 1. стр. 53-55.

BibTeX

@article{91f41320dda94269a4fa49ddac8a34a6,
title = "Determination of Young{\textquoteright}s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy",
abstract = "A scanning probe microscopy method that allows one to measure Young{\textquoteright}s modulus of thin and flexible nanowires is developed, which consists in measuring the deflection profiles under conditions of precise force control. This method can be applied to any thin and flexible one-dimensional or two-dimensional object. Using this approach, Young{\textquoteright}s moduli of thin InP conical nanowires with the wurtzite and zincblende structures are measured. It is found that nanowires with the pure wurtzite structure have a higher value of Young{\textquoteright}s modulus than the nanowires containing alternating wurtzite–zincblende phases.",
keywords = "scanning probe microscopy, semiconductor nanowires, wurtzite crystal structure, Young{\textquoteright}s modulus",
author = "Dunaevskiy, {M. S.} and Alekseev, {P. A.} and P. Geydt and E. Lahderanta and T. Haggren and H. Lipsanen",
note = "Determination of Young{\textquoteright}s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy / M. S. Dunaevskiy, P. A. Alekseev, P. Geydt [et al.] // Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. – 2019. – Vol. 13. – No 1. – P. 53-55. Publisher Copyright: {\textcopyright} 2019, Pleiades Publishing, Ltd.",
year = "2019",
month = jan,
day = "1",
doi = "10.1134/S1027451019010051",
language = "English",
volume = "13",
pages = "53--55",
journal = "Journal of Surface Investigation",
issn = "1027-4510",
publisher = "Maik Nauka Publishing / Springer SBM",
number = "1",

}

RIS

TY - JOUR

T1 - Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy

AU - Dunaevskiy, M. S.

AU - Alekseev, P. A.

AU - Geydt, P.

AU - Lahderanta, E.

AU - Haggren, T.

AU - Lipsanen, H.

N1 - Determination of Young’s Modulus of Wurtzite III–V Nanowires by the Methods of Scanning Probe Microscopy / M. S. Dunaevskiy, P. A. Alekseev, P. Geydt [et al.] // Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques. – 2019. – Vol. 13. – No 1. – P. 53-55. Publisher Copyright: © 2019, Pleiades Publishing, Ltd.

PY - 2019/1/1

Y1 - 2019/1/1

N2 - A scanning probe microscopy method that allows one to measure Young’s modulus of thin and flexible nanowires is developed, which consists in measuring the deflection profiles under conditions of precise force control. This method can be applied to any thin and flexible one-dimensional or two-dimensional object. Using this approach, Young’s moduli of thin InP conical nanowires with the wurtzite and zincblende structures are measured. It is found that nanowires with the pure wurtzite structure have a higher value of Young’s modulus than the nanowires containing alternating wurtzite–zincblende phases.

AB - A scanning probe microscopy method that allows one to measure Young’s modulus of thin and flexible nanowires is developed, which consists in measuring the deflection profiles under conditions of precise force control. This method can be applied to any thin and flexible one-dimensional or two-dimensional object. Using this approach, Young’s moduli of thin InP conical nanowires with the wurtzite and zincblende structures are measured. It is found that nanowires with the pure wurtzite structure have a higher value of Young’s modulus than the nanowires containing alternating wurtzite–zincblende phases.

KW - scanning probe microscopy

KW - semiconductor nanowires

KW - wurtzite crystal structure

KW - Young’s modulus

UR - http://www.scopus.com/inward/record.url?scp=85065463746&partnerID=8YFLogxK

UR - https://www.elibrary.ru/item.asp?id=38698165

U2 - 10.1134/S1027451019010051

DO - 10.1134/S1027451019010051

M3 - Article

AN - SCOPUS:85065463746

VL - 13

SP - 53

EP - 55

JO - Journal of Surface Investigation

JF - Journal of Surface Investigation

SN - 1027-4510

IS - 1

M1 - 9

ER -

ID: 35358493