Determination of Rare Impurities in High-Purity Germanium and Germanium Oxide by Inductively Coupled Plasma Atomic Emission Spectrometry

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Determination of Rare Impurities in High-Purity Germanium and Germanium Oxide by Inductively Coupled Plasma Atomic Emission Spectrometry. / Guselnikova, T. Ya ; Tsygankova, A. R.

в: Inorganic Materials, Том 57, № 4, 04.2021, стр. 409-416.

Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование

BibTeX

@article{1b93801df81f4bdfb822be68cda0406d,

title = "Determination of Rare Impurities in High-Purity Germanium and Germanium Oxide by Inductively Coupled Plasma Atomic Emission Spectrometry",

abstract = "We have proposed a combination of techniques for quantitative chemical analysis of high-purity germanium and germanium oxide by inductively coupled plasma atomic emission spectrometry. The techniques are intended for determination of the rare-earth (RE) elements (except Pm), platinum group metals (PGMs) (except Os), I, S, Th, Tl, and U after acid dissolution of a sample (instrumental technique) and after separation of the matrix in the form of a highly volatile compound (combined technique). The instrumental technique allows all of the above elements to be determined. To take into account the effect of germanium on analytical signals of analytes, use is made of Be, Dy, or Gd internal standards. The best results in spike experiments have been obtained for the RE elements, PGMs, and I with the Be 234.861 nm; for Th, Tl, and U with the Dy 353.170 nm; and for S with no internal standards. The analyte detection limits (DLs) lie in the range n × 10–6 to n × 10–5 wt %. The combined technique is intended for lowering the DLs for Ir, Pd, Pt, Rh, Ru, S, Th, Tl, and U. Germanium was removed from weighed samples of germanium metal and germanium dioxide in the form of GeCl4 to above 99.99%. The analyte DLs were then from n × 10–7 to n × 10–6 wt %.",

keywords = "impurity preconcentration, internal standard, semiconductor germanium",

author = "Guselnikova, {T. Ya} and Tsygankova, {A. R.}",

year = "2021",

month = apr,

doi = "10.1134/S0020168521040051",

language = "English",

volume = "57",

pages = "409--416",

journal = "Inorganic Materials",

issn = "0020-1685",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "4",

}

RIS

TY - JOUR

T1 - Determination of Rare Impurities in High-Purity Germanium and Germanium Oxide by Inductively Coupled Plasma Atomic Emission Spectrometry

AU - Guselnikova, T. Ya

AU - Tsygankova, A. R.

PY - 2021/4

Y1 - 2021/4

N2 - We have proposed a combination of techniques for quantitative chemical analysis of high-purity germanium and germanium oxide by inductively coupled plasma atomic emission spectrometry. The techniques are intended for determination of the rare-earth (RE) elements (except Pm), platinum group metals (PGMs) (except Os), I, S, Th, Tl, and U after acid dissolution of a sample (instrumental technique) and after separation of the matrix in the form of a highly volatile compound (combined technique). The instrumental technique allows all of the above elements to be determined. To take into account the effect of germanium on analytical signals of analytes, use is made of Be, Dy, or Gd internal standards. The best results in spike experiments have been obtained for the RE elements, PGMs, and I with the Be 234.861 nm; for Th, Tl, and U with the Dy 353.170 nm; and for S with no internal standards. The analyte detection limits (DLs) lie in the range n × 10–6 to n × 10–5 wt %. The combined technique is intended for lowering the DLs for Ir, Pd, Pt, Rh, Ru, S, Th, Tl, and U. Germanium was removed from weighed samples of germanium metal and germanium dioxide in the form of GeCl4 to above 99.99%. The analyte DLs were then from n × 10–7 to n × 10–6 wt %.

AB - We have proposed a combination of techniques for quantitative chemical analysis of high-purity germanium and germanium oxide by inductively coupled plasma atomic emission spectrometry. The techniques are intended for determination of the rare-earth (RE) elements (except Pm), platinum group metals (PGMs) (except Os), I, S, Th, Tl, and U after acid dissolution of a sample (instrumental technique) and after separation of the matrix in the form of a highly volatile compound (combined technique). The instrumental technique allows all of the above elements to be determined. To take into account the effect of germanium on analytical signals of analytes, use is made of Be, Dy, or Gd internal standards. The best results in spike experiments have been obtained for the RE elements, PGMs, and I with the Be 234.861 nm; for Th, Tl, and U with the Dy 353.170 nm; and for S with no internal standards. The analyte detection limits (DLs) lie in the range n × 10–6 to n × 10–5 wt %. The combined technique is intended for lowering the DLs for Ir, Pd, Pt, Rh, Ru, S, Th, Tl, and U. Germanium was removed from weighed samples of germanium metal and germanium dioxide in the form of GeCl4 to above 99.99%. The analyte DLs were then from n × 10–7 to n × 10–6 wt %.

KW - impurity preconcentration

KW - internal standard

KW - semiconductor germanium

UR - http://www.scopus.com/inward/record.url?scp=85104556205&partnerID=8YFLogxK

U2 - 10.1134/S0020168521040051

DO - 10.1134/S0020168521040051

M3 - Article

AN - SCOPUS:85104556205

VL - 57

SP - 409

EP - 416

JO - Inorganic Materials

JF - Inorganic Materials

SN - 0020-1685

IS - 4

ER -

ID: 28499839