Standard

Control of the conducting surface by terahertz surface electromagnetic waves. / Nikitin, A. K.; Gerasimov, V. V.; Knyazev, B. A. и др.

в: Journal of Physics: Conference Series, Том 1636, № 1, 012036, 09.10.2020.

Результаты исследований: Научные публикации в периодических изданиях › статья по материалам конференции › Рецензирование

Harvard

Nikitin, AK, Gerasimov, VV, Knyazev, BA, Lien, NTH & Trang, TT 2020, 'Control of the conducting surface by terahertz surface electromagnetic waves', Journal of Physics: Conference Series, Том. 1636, № 1, 012036. https://doi.org/10.1088/1742-6596/1636/1/012036

APA

Nikitin, A. K., Gerasimov, V. V., Knyazev, B. A., Lien, N. T. H., & Trang, T. T. (2020). Control of the conducting surface by terahertz surface electromagnetic waves. Journal of Physics: Conference Series, 1636(1), [012036]. https://doi.org/10.1088/1742-6596/1636/1/012036

Vancouver

Nikitin AK, Gerasimov VV, Knyazev BA, Lien NTH, Trang TT. Control of the conducting surface by terahertz surface electromagnetic waves. Journal of Physics: Conference Series. 2020 окт. 9;1636(1):012036. doi: 10.1088/1742-6596/1636/1/012036

Author

Nikitin, A. K. ; Gerasimov, V. V. ; Knyazev, B. A. и др. / Control of the conducting surface by terahertz surface electromagnetic waves. в: Journal of Physics: Conference Series. 2020 ; Том 1636, № 1.

BibTeX

@article{18b6914c6b2249babb29f58f6ffbe2c6,
title = "Control of the conducting surface by terahertz surface electromagnetic waves",
abstract = "The paper considers the possibilities of quality control of the conductive surface and detection of objects on it beyond the horizon, as well as microscopy of flat faces of semiconductor products using surface electromagnetic waves (SEWs) of the terahertz (THz) range. The conditions under which such methods of control can be implemented are determined; schemes of devices that implement such measurements are elaborated; estimates of the possibilities of the developed methods for monitoring metal and semiconductor products probed by monochromatic THz radiation in the form of SEWs are given.",
author = "Nikitin, {A. K.} and Gerasimov, {V. V.} and Knyazev, {B. A.} and Lien, {N. T.H.} and Trang, {T. T.}",
year = "2020",
month = oct,
day = "9",
doi = "10.1088/1742-6596/1636/1/012036",
language = "English",
volume = "1636",
journal = "Journal of Physics: Conference Series",
issn = "1742-6588",
publisher = "IOP Publishing Ltd.",
number = "1",
note = "22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 ; Conference date: 03-03-2020 Through 05-03-2020",

}

RIS

TY - JOUR

T1 - Control of the conducting surface by terahertz surface electromagnetic waves

AU - Nikitin, A. K.

AU - Gerasimov, V. V.

AU - Knyazev, B. A.

AU - Lien, N. T.H.

AU - Trang, T. T.

PY - 2020/10/9

Y1 - 2020/10/9

N2 - The paper considers the possibilities of quality control of the conductive surface and detection of objects on it beyond the horizon, as well as microscopy of flat faces of semiconductor products using surface electromagnetic waves (SEWs) of the terahertz (THz) range. The conditions under which such methods of control can be implemented are determined; schemes of devices that implement such measurements are elaborated; estimates of the possibilities of the developed methods for monitoring metal and semiconductor products probed by monochromatic THz radiation in the form of SEWs are given.

AB - The paper considers the possibilities of quality control of the conductive surface and detection of objects on it beyond the horizon, as well as microscopy of flat faces of semiconductor products using surface electromagnetic waves (SEWs) of the terahertz (THz) range. The conditions under which such methods of control can be implemented are determined; schemes of devices that implement such measurements are elaborated; estimates of the possibilities of the developed methods for monitoring metal and semiconductor products probed by monochromatic THz radiation in the form of SEWs are given.

UR - http://www.scopus.com/inward/record.url?scp=85092671859&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1636/1/012036

DO - 10.1088/1742-6596/1636/1/012036

M3 - Conference article

AN - SCOPUS:85092671859

VL - 1636

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012036

T2 - 22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020

Y2 - 3 March 2020 through 5 March 2020

ER -

ID: 25645794