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Chemical kinetics and thermodynamics of the AlN crystalline phase formation on sapphire substrate in ammonia MBE. / Milakhin, D. S.; Malin, T. V.; Mansurov, V. G. и др.
в: Journal of Thermal Analysis and Calorimetry, Том 133, № 2, 01.08.2018, стр. 1099-1107.Результаты исследований: Научные публикации в периодических изданиях › статья › Рецензирование
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TY - JOUR
T1 - Chemical kinetics and thermodynamics of the AlN crystalline phase formation on sapphire substrate in ammonia MBE
AU - Milakhin, D. S.
AU - Malin, T. V.
AU - Mansurov, V. G.
AU - Galitsyn, Y. G.
AU - Zhuravlev, K. S.
PY - 2018/8/1
Y1 - 2018/8/1
N2 - Chemical kinetics of a two-dimensional (2D) AlN layer formation on the (0001) sapphire (Al2O3) surface during nitridation as function of ammonia flux and temperature is investigated by reflection high-energy electron diffraction. The process on the surface is described in framework of a chemical reactions kinetic model including interaction between partially reduced aluminum oxide species (AlO) and chemisorbed NH2 particles for the temperature range < 1210 K. The experimentally determined AlN formation rates as functions of both the temperature and the ammonia pressure are successfully described by a simple set of kinetic equations. Calculated maximum rate of the process well agrees with the experimental values. It was found that AlN formation rate is independent from temperature for the temperature range > 1210 K. In this range, the process is described as a phase transition in frame of lattice gas model. Precision measurement of 2D AlN lattice parameters during the nitridation process detects the value of 0.301 nm. This value strongly differs from bulk value of wurtzite AlN structure 0.311 nm, but it coincides exactly with a characteristic structure parameter of the oxygen-deficient (0001) Al2O3 surface with reconstruction (√31×√31)R ± 9°. We assume that this coincidence is the result of minimizing the elastic stresses at the heterojunction of the 2D AlN and the (0001) Al2O3 layer.
AB - Chemical kinetics of a two-dimensional (2D) AlN layer formation on the (0001) sapphire (Al2O3) surface during nitridation as function of ammonia flux and temperature is investigated by reflection high-energy electron diffraction. The process on the surface is described in framework of a chemical reactions kinetic model including interaction between partially reduced aluminum oxide species (AlO) and chemisorbed NH2 particles for the temperature range < 1210 K. The experimentally determined AlN formation rates as functions of both the temperature and the ammonia pressure are successfully described by a simple set of kinetic equations. Calculated maximum rate of the process well agrees with the experimental values. It was found that AlN formation rate is independent from temperature for the temperature range > 1210 K. In this range, the process is described as a phase transition in frame of lattice gas model. Precision measurement of 2D AlN lattice parameters during the nitridation process detects the value of 0.301 nm. This value strongly differs from bulk value of wurtzite AlN structure 0.311 nm, but it coincides exactly with a characteristic structure parameter of the oxygen-deficient (0001) Al2O3 surface with reconstruction (√31×√31)R ± 9°. We assume that this coincidence is the result of minimizing the elastic stresses at the heterojunction of the 2D AlN and the (0001) Al2O3 layer.
KW - III-nitrides
KW - Molecular beam epitaxy
KW - Nitridation
KW - Reflection high-energy electron diffraction (RHEED)
KW - Surface processes
KW - PLASMA
KW - GAN
KW - AIN
KW - SURFACE-STRUCTURE
KW - GROWTH
KW - NITRIDATION PROCESS
UR - http://www.scopus.com/inward/record.url?scp=85049739122&partnerID=8YFLogxK
U2 - 10.1007/s10973-018-7116-z
DO - 10.1007/s10973-018-7116-z
M3 - Article
AN - SCOPUS:85049739122
VL - 133
SP - 1099
EP - 1107
JO - Journal of Thermal Analysis and Calorimetry
JF - Journal of Thermal Analysis and Calorimetry
SN - 1388-6150
IS - 2
ER -
ID: 14481914