TY - JOUR

T1 - Array of dielectric Mie particles with optical surface resonances as a promising coating for thin-film photoelectronic device applications

AU - Shklyaev, A. A.

AU - Utkin, D. E.

AU - Tsarev, A. V.

AU - Latyshev, A. V.

N1 - Сведения о финансировании Финансирующий спонсор Номер финансирования Advanced Technology Research Council Russian Science Foundation 23-72-30003

PY - 2025/3

Y1 - 2025/3

N2 - Metasurfaces can concentrate light within thin functional layers of photoelectronic devices. To determine the spatial distribution of light scattered on metasurfaces, we investigated the effects of optical resonances in Ge nanodisk lattices in an indium tin oxide (ITO) layer on a glass substrate. Thermal evaporation in vacuum and RF magnetron sputtering methods were used for the deposition of Ge and ITO, respectively. To exclude the influence of interfaces, absorption spectra were obtained without taking into account the contribution of reflection. Calculations made it possible to identify the nature of the peaks in the experimental absorption spectra and determine the spectral positions of surface lattice resonances in the ITO layer and at the interfaces with the substrate and air, as well as the absorption peak caused by the lattice Kerker effect. The results show that up to 40 % of the incident light, depending on the spectral range, is scattered in the direction along the substrate surface layers and at angles to it. This fraction of scattered light can increase the efficiency of thin-film photoelectronic devices.

AB - Metasurfaces can concentrate light within thin functional layers of photoelectronic devices. To determine the spatial distribution of light scattered on metasurfaces, we investigated the effects of optical resonances in Ge nanodisk lattices in an indium tin oxide (ITO) layer on a glass substrate. Thermal evaporation in vacuum and RF magnetron sputtering methods were used for the deposition of Ge and ITO, respectively. To exclude the influence of interfaces, absorption spectra were obtained without taking into account the contribution of reflection. Calculations made it possible to identify the nature of the peaks in the experimental absorption spectra and determine the spectral positions of surface lattice resonances in the ITO layer and at the interfaces with the substrate and air, as well as the absorption peak caused by the lattice Kerker effect. The results show that up to 40 % of the incident light, depending on the spectral range, is scattered in the direction along the substrate surface layers and at angles to it. This fraction of scattered light can increase the efficiency of thin-film photoelectronic devices.

KW - 3D FDTD modeling

KW - Dielectric metasurfaces

KW - Light concentration

KW - Mie resonances

KW - Surface lattice resonances

UR - https://www.mendeley.com/catalogue/cd1568a3-c373-3c2b-8cb1-f6123632b8ea/

UR - https://www.scopus.com/record/display.uri?eid=2-s2.0-85212956789&origin=inward&txGid=16d119ac27445e74c87c413b43b342ed

U2 - 10.1016/j.vacuum.2024.113976

DO - 10.1016/j.vacuum.2024.113976

M3 - Article

VL - 233

JO - Vacuum

JF - Vacuum

SN - 0042-207X

M1 - 113976

ER -